Variable-temperature sample stage for XRD and atomic force microscopes and using method of variable-temperature sample stage

Abstract

The invention discloses a variable-temperature sample stage for XRD and atomic force microscopes and a using method thereof. The variable-temperature sample stage for XRD and atomic force microscopes comprises a sample stage base, wherein a stand column is arranged at the top of the sample stage base, a first fixing nut is arranged at the top end of the stand column, a center stud is arranged at the top of the sample stage base, an objective table is arranged at the top of the center stud, a supporting platform is arranged on one side of the top of the stand column, a through hole is formed in the objective table, a heating sheet is arranged at the bottom of the objective table, and a magnetic sheet is arranged at the bottom of the sample table base. The variable-temperature sample stage solves the problems that a variable temperature sample stage simultaneously meeting XRD and AFM does not exist at present, an existing variable temperature sample table is poor in compatibility and difficult to simultaneously meet test requirements of various instruments, and a variable temperature device equipped on an existing test instrument is high in manufacturing cost, complex in equipment, high in operation difficulty, easy to damage and high in maintenance cost.

Description

technical field [0001] The invention relates to the fields of X-ray diffraction and atomic force microscopy, in particular to a variable temperature sample stage for XRD and atomic force microscopy and a use method thereof. Background technique [0002] In the current material research, XRD and AFM are widely used to obtain the phase composition, crystal structure, surface morphology, electric polarization, magnetic polarization and other information of the material. X-ray is an electromagnetic wave with a short wavelength, which can penetrate certain Thickness of the material, and can make fluorescent material light, photosensitive material photosensitive, gas ionization. The X-ray light source uses electron beams to bombard the metal target to generate X-rays. Among the generated X-rays, some of the X-rays correspond to the elements in the target. These X-rays are called characteristic (or identification) X-rays. X-ray, XRD is one of the most powerful and fastest analysis...

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Problems solved by technology

[0003] At present, there is no variable temperature sample stage that can meet both XRD and AFM. The existing variable temperature sample stage has poor compatibility, and it is difficult to meet the testing requirements of multiple instruments at the same time. The variable temperature device equipped with the existing test instrument is expensive, complicated and difficult to operate. , easy to damage, and high maintenance cost

[0004] At present, there is a lack of a low-cost variable temperature sample stage for XRD and atomic force microscopy and its use method

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