Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Star sensor in-orbit measurement low-frequency error analysis method and device and storage medium

A star sensor and low-frequency error technology, applied in the field of satellite measurement and control, can solve the problem of inability to accurately analyze low-frequency errors

Active Publication Date: 2021-05-11
NAT UNIV OF DEFENSE TECH
View PDF7 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the time-related characteristics of low-frequency errors, traditional filtering algorithms are helpless, that is, there are technical problems that cannot accurately analyze low-frequency errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Star sensor in-orbit measurement low-frequency error analysis method and device and storage medium
  • Star sensor in-orbit measurement low-frequency error analysis method and device and storage medium
  • Star sensor in-orbit measurement low-frequency error analysis method and device and storage medium

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach

[0095] The first step is to extract the on-orbit measurement error of the star sensor optical axis angle.

[0096] 1) Given the installation matrix for ground calibration of two star sensors:

[0097] The columns of the installation matrix A_M of star sensor A are:

[0098] A_M(:,1)=[0.930885545362288,0.065660803172965,

[0099] -0.359361601123767] T ;

[0100] A_M(:,2)=[-0.127373863690569,-0.863642129071981,

[0101] -0.487748061749663] T ;

[0102] A_M(:,3)=[-0.342385747781785,0.499810896058397,

[0103] -0.795588504125851] T .

[0104] The columns of the installation matrix B_M of star sensor B are:

[0105] B_M(:,1)=[0.609566689771216,-0.753441641227755,

[0106] -0.246483557231287] T ;

[0107] B_M(:,2)=[-0.722894629806934,-0.400702445501839,

[0108] -0.562903992138217] T ;

[0109] B_M(:,3)=[0.325348743531705,0.521309163004902,

[0110] -0.788913779604254] T .

[0111] Use the above formula (3) to calculate the angle α between the optical axes of star ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a star sensor in-orbit measurement low-frequency error analysis method and device and a storage medium, and the method comprises the following steps: determining an in-orbit measurement error of an included angle of optical axes of two star sensors according to the difference between the included angle of the optical axes of the two star sensors in in-orbit measurement in an inertial system and the included angle of the optical axes of the two star sensors in installation in a satellite body system, wherein the two star sensors are star sensors on the same target satellite; performing spectral analysis on the gyro constant drift on-orbit estimation data of the target satellite, and extracting periodic characteristics of a star sensor on-orbit measurement low-frequency error term of the target satellite; according to the in-orbit measurement error and the periodic characteristic of the optical axis included angle, constructing a fine fitting model of the in-orbit measurement low-frequency error of the star sensor through a constant term and a periodic basis function; determining the constant term by the on-orbit measurement error, wherein the fine fitting model is used for determining the on-orbit low-frequency error of the star sensor. By adopting the scheme, the purpose of high-precision analysis of the low-frequency error in the in-orbit measurement of the star sensor is achieved.

Description

technical field [0001] The present application relates to the technical field of satellite measurement and control, in particular to a method, device and storage medium for analyzing low-frequency errors in on-orbit measurement of star sensors. Background technique [0002] High-precision attitude estimation is the premise and guarantee for realizing high-precision and high-reliability attitude control. The star sensor plays an important role in the attitude measurement and control system of the spacecraft, and is the most precise attitude measurement component. However, when the star sensor is used in orbit, its internal parameters will change due to the impact it receives when it is launched, the change of the working environment, and the aging and wear caused by long-term work. In order to ensure the measurement accuracy and reliability of the star sensor, it is necessary to carry out on-orbit calibration. According to the 2008 German JENA company and ESA star sensor de...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01C25/00
CPCG01C25/00Y02D30/70
Inventor 矫媛媛张青青潘晓刚蔡伟伟周萱影王炯琦王世金
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products