Correction method and system for CMOS image sensor and image processing equipment

Abstract

The invention provides a correction method and system for a CMOS image sensor and image processing equipment, and the method comprises the following steps: obtaining an initial environment temperature after the CMOS image sensor is powered on; acquiring an image required by correction, and calculating a correction parameter according to the image required by correction; acquiring an environment temperature change value; judging whether the environment temperature change value is greater than or equal to a preset environment temperature change value; if yes, obtaining the image needed by correction again, calculating the correction parameters again, and obtaining the corrected correction parameters; and correcting the CMOS image sensor according to the corrected correction parameters. In the working process of equipment, the correction parameters of the CMOS image sensor can be corrected according to the environment temperature change condition, the accuracy and reliability of the correction parameters are improved, the temperature adaptability of the CMOS image sensor is improved, the correction result is accurate and reliable, column noise is effectively eliminated, and the image quality is improved.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a calibration method, system and image processing equipment of a CMOS image sensor. Background technique [0002] At present, the mainstream processing structure of CMOS (Complementary Metal Oxide Semiconductor, Complementary Metal Oxide Semiconductor) image sensor system is to use a column-sharing processing circuit, that is, each column of pixels shares a set of signal processing circuits. The most obvious problem with this structure is that the columns The column noise problem caused by the mismatch of the shared processing circuit is called column fixed pattern noise. Column fixed pattern noise can be clearly observed in uncorrected CMOS image sensors, appearing as bright and dark "vertical lines" on the image. Therefore, when in use, each column of the CMOS image sensor needs to be corrected to eliminate these "vertical lines", that is, to eliminate column fixed pa...

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Problems solved by technology

[0004] However, the above-mentioned method of obtaining and storing sensor calibration parameters in advance is not applicable in occasions where the temperature changes significantly, because the temperature change will affect the calibration parameters, resulting in inaccurate calibration results and affecting the quality of the image; The method of correcting parameters may change after the equipment is used for a period of time, which will also lead to inaccurate calibration results and affect the quality of the image

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