A state-configurable in-situ aging sensor system

Abstract

The invention discloses a state-configurable in-situ aging sensor system, which includes an inverter, n buffer modules and a first counter; each buffer module includes a state configuration unit, a mode selector and a buffer connected in sequence , the mode selector in each buffer module is the external input terminal of the buffer module, and the buffer in each buffer module is the output terminal of the buffer module; the output terminal of the mth buffer module is connected to the m+1th buffer module The external input terminals of the modules are connected; the output terminal of the inverter is connected with the external input terminal of the first buffer module; the output terminal of the last buffer module is respectively connected with the input terminal of the inverter and the input terminal of the first counter. The present invention adopts the state configuration unit, so that the signal probability and signal flip rate of the intermediate node of the link can be configured, and solves the problem in the prior art that the state of the intermediate node of the sensor combination logic link is fixed, which leads to the inability to perform aging prediction on the complex logic circuit .

Description

technical field [0001] The invention relates to the field of integrated circuit aging prediction, in particular to an in-situ aging sensor system with configurable states. Background technique [0002] In integrated circuits, with the continuous reduction of transistor process dimensions, the reliability of the system has become increasingly prominent, and aging is one of the main factors affecting the reliability of integrated circuits. Many aging mechanisms, such as Negative Bias Temperature Instability (NBTI), Hot Carrier Injection (HCI), and Time-Dependent Dielectric Breakdown (TDDB), make the failure rate of integrated circuits increase rapidly over time during service life. High, it has a serious impact on the service life of the circuit, and even leads to the failure of the entire circuit system. Especially in the field of high reliability, such as space field, aircraft, motor vehicle and other systems, once the consequences of failure are unimaginable, these fields ...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above deficiencies in the prior art, the present invention provides a state-configurable in-situ aging sensor system that solves the problem that the prior art cannot predict the aging of complex logic circuits

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