Inorganic mass spectrometer

An inorganic mass spectrometer and particle beam technology, which is applied in the field of mass spectrometry instruments, can solve the problems that the measurement sensitivity and accuracy of inorganic mass spectrometers cannot meet the needs of measurement.

Pending Publication Date: 2021-04-09
姜山
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, the measurement sensitivity and precision of i...

Method used

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  • Inorganic mass spectrometer

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Embodiment

[0036] Such as figure 1 As shown, the inorganic mass spectrometer of the present invention includes: a multi-charged ion source 1 , a front-end analysis device, a back-end analysis device and an ion detector 4 .

[0037] The multiple charge state ion source 1 is connected to the front-end analysis device, the front-end analysis device is connected to the back-end analysis device, and the back-end analysis device is connected to the ion detector 4 .

[0038] The multiple charge state ion source 1 is used to generate an intense ion beam current of 3+, 4+ or more valence charge states. The high-current ion beams include: constant particle beams, micro particle beams, trace particle beams and ultra-trace particle beams, and the ultra-trace particle beams include ultra-trace isotopes and ultra-trace ions end.

[0039] For example, for CO 2 gas, capable of producing C + 、C 2+ 、C 3+ 、C 4+ 、C 5+ and C 6+ and other ions. where C 2+ and C + are double-charged and single-char...

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Abstract

The invention discloses an inorganic mass spectrometer, which is an inorganic mass spectrometer based on a multi-charge-state ion source, and the specific structure of the inorganic mass spectrometer comprises a multi-charge-state ion source, a front-end analysis system, a rear-end subsystem and an ion detector. The multi-charge-state ion source is connected with the front-end analysis system, the front-end analysis system is connected with the rear-end analysis system, and the rear-end analysis system is connected with the ion detector. The instrument has the capabilities of eliminating molecular backgrounds and lowering isotopic element backgrounds, and also has the advantages of strong beam current, high transmission efficiency and the like, so that the measurement sensitivity and the measurement precision of the inorganic mass spectrometer are remarkably improved.

Description

technical field [0001] The invention relates to the field of mass spectrometry instruments, in particular to an inorganic mass spectrometer. Background technique [0002] Existing inorganic mass spectrometer is made up of ion source system, analyzer system (mainly including electrostatic analyzer, magnetic analyzer, time-of-flight analyzer and quadrupole analyzer, etc.) and ion detector system, see figure ( 1). In the measurement of inorganic mass spectrometer, due to the interference of molecular ion background and isobaric ion background, the measurement sensitivity of inorganic mass spectrometer is affected, and its minimum detection line can reach 10 -12 g / g range, reaching the analysis range of trace. The measurement accuracy reaches 0.5%. [0003] Due to the in-depth development of research on materials, nuclear energy, environment, geology, biomedicine, archaeology, oceans and other disciplines, it is necessary to improve the measurement sensitivity and measurement...

Claims

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Application Information

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IPC IPC(8): H01J49/26H01J49/10
CPCH01J49/26H01J49/10H01J49/0086H01J49/126H01J49/025H01J49/061
Inventor 姜山
Owner 姜山
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