ADC error automatic correction method and device, analog-to-digital conversion circuit and storage medium

Abstract

The invention discloses an ADC error automatic correction method and device, an analog-to-digital conversion circuit and a storage medium, and the method comprises the steps: generating at least two paths of preset input voltage signals which form a preset proportion with a reference input voltage signal through a reference proportion generation circuit; based on a preset conversion rule, obtaining an offset error value and a gain error value corresponding to ADC correction through a preset input voltage signal; correcting the obtained to-be-corrected input voltage signal based on the offset error value and the gain error value, so that a preset input voltage signal forming a preset proportion with the reference input voltage signal is generated through a reference proportion generation circuit; and therefore, the correction of gain error values and offset error values of various types of ADCs can be satisfied without knowing the specific value of the reference source. Moreover, the correction process of the embodiment is fully automatic, an external correction tool and correction operation of professionals are not needed, the labor cost and the operation time are saved, and the correction effect is accurate.

Description

technical field [0001] The invention relates to the technical field of analog output testing, in particular to an ADC error automatic correction method, device, analog-to-digital conversion circuit and storage medium. Background technique [0002] Analog-to-digital data conversion ADC is widely used in various instruments and daily electrical equipment to convert analog signals in nature such as temperature, humidity, speed, brightness and other signals into digital signals that can be processed by computers for processing and control. The accuracy and other performance of the ADC determine whether the machine system can accurately obtain natural signals. However, the ADC circuit must have conversion errors caused by manufacturing process deviations, device mismatches, and environmental factors. Among them, offset error value and gain error value are the two most common errors in ADC. [0003] The traditional method of correcting the offset error value of the ADC offset err...

AI Technical Summary

Problems solved by technology

However, in applications where the reference source changes, for example, the external reference source is powered by a battery, and the reference source will change with the charging and discharging process; or the internal reference source is used, and the internal reference source will also If there is a change, the uncertainty of the reference source will lead to the uncertainty of the ideal output value, so that the accurate information of the offset error value cannot be obtained

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