A method of measuring nuclear polarizability by atomic spin gyroscope based on adiabatic fast channel
An adiabatic fast channel, atomic spin technology, which is applied in the direction of using electron paramagnetic resonance for analysis, steering induction equipment, etc., which can solve the problems that nuclear spin polarization cannot be accurately measured, affect the zero bias stability of gyroscopes, and cannot be shielded. , to achieve the effect of miniaturization and closed-loop precise control of nuclear polarizability, optimization of background magnetic field size and gradient, and getting rid of the dependence of optical path and circuit
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0024] Below in conjunction with the accompanying drawings ( Figure 1-Figure 3 ) and the examples illustrate the invention.
[0025] figure 1 It is a schematic flow chart of implementing the method for measuring nuclear polarizability based on the adiabatic fast channel atomic spin gyroscope of the present invention. figure 2 It is another schematic flow chart of implementing the method for measuring nuclear polarizability based on the adiabatic fast channel atomic spin gyroscope of the present invention. image 3 It is a schematic diagram of the system structure used to implement the method for measuring nuclear polarizability based on the adiabatic fast channel atomic spin gyroscope of the present invention. refer to Figure 1 to Figure 3As shown, the method of measuring nuclear polarizability with atomic spin gyroscope based on adiabatic fast channel is characterized in that when the atomic gyroscope works, the macroscopic polarization direction of nuclear spin is in t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com