Ultra-high temporal and spatial resolution imaging system and method for photoelectron microscope with multiple excitation light sources

Abstract

The invention discloses an ultra-high space-time resolution imaging system and method of a multi-excitation light source photoelectron microscope. The invention adopts a periodic pumping and detecting optical circuit, an extreme ultraviolet pumping and detecting optical circuit, a wavelength tunable pumping and detecting optical circuit, a flip mirror and an integrated system of an optoelectronic microscope. Therefore, it is suitable for ultra-high temporal and spatial resolution imaging of different sample materials and different ultrafast processes; the invention combines the photoelectron microscope with the femtosecond pump detection, so that the photoelectron microscope has the ultrafast temporal resolution capability, so that ultra-high spatial resolution can be realized high-speed and ultrafast time-resolved imaging; at the same time, switching between multiple excitation light source systems makes the invention suitable for high spatiotemporal resolution studies of different material systems and different ultrafast processes, which will help researchers directly record a large number of nanoscale ultrafast processes. Fast kinetic processes are of great help in studying the physical nature behind phenomena.

Description

technical field [0001] The invention relates to an ultrahigh temporal and spatial resolution imaging technology, in particular to an ultrahigh temporal and spatial resolution imaging system and method for a photoelectron microscope with multiple excitation light sources. Background technique [0002] The ultrafast dynamic process at the nanoscale is often the most important mechanism for determining physical phenomena and material properties, so it has always been a research hotspot in different disciplines such as optoelectronics, materials science, and chemistry. With the maturity of femtosecond ultrafast technology and microscopy technology, the combination of these two technologies can achieve the ability of high time resolution and high space resolution at the same time. Scanning near-field optical microscopy (SNOM) collects the near-field optical field intensity by scanning the probe to achieve spatially resolved imaging of <50nm near-field optical modes. In additi...

AI Technical Summary

Problems solved by technology

However, by summarizing the existing space-time detection technologies, it can be found that it is difficult to simultaneously achieve ultra-high resolution detection in two dimensions of space and time.

Moreover, in order to improve the spatial resolution, most detection technologies adopt the method of spatial scanning, which will lead to a long detection process, uneven imaging, difficult experiments, and the inability to realize real-time imaging.

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