Ultrahigh space-time resolution imaging system and method of multi-excitation-light-source photoelectron microscope

Abstract

The invention discloses an ultrahigh space-time resolution imaging system and method of a multi-excitation-light-source photoelectron microscope. According to the invention, a periodic pumping detection light path, an extreme ultraviolet pumping detection light path, a wavelength tunable pumping detection light path, an overturning mirror and an optical electron microscope integrated system are adopted, and the three light paths are switched according to the requirements of sample materials and time resolution, so that the system is suitable for ultrahigh time-space resolution imaging of different sample materials and different ultrafast processes; according to the invention, the photoelectron microscope is combined with femtosecond pumping detection, so that the photoelectron microscope has ultrafast time resolution capability, and imaging with ultrahigh spatial resolution and ultrafast time resolution can be realized; meanwhile, due to switching among multiple excitation light sourcesystems, the system is suitable for high-temporal-spatial-resolution research of different material systems and different ultrafast processes, a researcher can be helped directly record a large number of ultrafast dynamic processes in the nanoscale, and great help is provided for physical nature behind the research phenomenon.

Description

technical field [0001] The invention relates to an ultrahigh temporal and spatial resolution imaging technology, in particular to an ultrahigh temporal and spatial resolution imaging system and method for a photoelectron microscope with multiple excitation light sources. Background technique [0002] The ultrafast dynamic process at the nanoscale is often the most important mechanism for determining physical phenomena and material properties, so it has always been a research hotspot in different disciplines such as optoelectronics, materials science, and chemistry. With the maturity of femtosecond ultrafast technology and microscopy technology, the combination of these two technologies can achieve the ability of high time resolution and high space resolution at the same time. Scanning near-field optical microscopy (SNOM) collects the near-field optical field intensity by scanning the probe to achieve spatially resolved imaging of <50nm near-field optical modes. In additi...

AI Technical Summary

Problems solved by technology

However, by summarizing the existing space-time detection technologies, it can be found that it is difficult to simultaneously achieve ultra-high resolution detection in two dimensions of space and time.

Moreover, in order to improve the spatial resolution, most detection technologies adopt the method of spatial scanning, which will lead to a long detection process, uneven imaging, difficult experiments, and the inability to realize real-time imaging.

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