Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Directional diagram reconstruction and restoration method after array element failure of broadband wide-angle scanning phased-array antenna

A phased array antenna, wide-angle scanning technology, applied in the directions of antenna arrays, antennas, electrical components, etc., can solve problems such as failure of wide-bandwidth angle scanning phased array antenna elements

Active Publication Date: 2021-02-05
NANJING UNIV OF SCI & TECH
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a method for reconstructing and repairing the pattern of a wide bandwidth angular scanning phased array antenna element failure, which is used to solve the problem of the failure of the wide bandwidth angular scanning phased array antenna element

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Directional diagram reconstruction and restoration method after array element failure of broadband wide-angle scanning phased-array antenna
  • Directional diagram reconstruction and restoration method after array element failure of broadband wide-angle scanning phased-array antenna
  • Directional diagram reconstruction and restoration method after array element failure of broadband wide-angle scanning phased-array antenna

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0104] combine Figure 4 , Figure 5 , Figure 6 According to the repair algorithm of the present invention, the wide bandwidth angle scanning line array after partial array element failure is repaired, and its validity is verified. Firstly, construct the model of the wideband sparse wiring array, the total number of array elements is 64, and the bandwidth is 3 times the broadband sparse array. The value range of the array element spacing is [0.6λ h ,1.2λ h ], the array aperture is 55.09λ h ,λ h is a high-frequency wavelength, given the case of a scan angle of 30°. Now consider 4 array elements randomly failing out of 64 array elements, the position is as follows Figure 4 shown.

[0105] Use the brainstorming optimization algorithm to optimize the amplitude of the remaining intact elements for repair. The number of selected populations is set to 200, θ is uniformly sampled in the range of [-90°, 90°] at intervals of 0.1°, and the threshold is set to -18.37. The numbe...

Embodiment 2

[0110] combine Figure 7 ~ Figure 10 According to the repair algorithm of the present invention, the wide bandwidth angular scanning area array after partial array element failure is repaired, and its validity is verified. First construct a circular wide-band planar array, divide the circular area into 9 sectors for optimization, the total number of array elements is N=108, the bandwidth is 3 times the frequency, and the scanning angle is 30°. Each array element is established under equal-amplitude excitation Initial broadband array model. The minimum element spacing of the expected array is 0.49λ L , the array radius is 4.05λ L ,λ L It is a low-frequency wavelength, so at medium and high frequencies, the distance between the array elements is relatively large, and the mutual coupling between elements can basically be ignored. Now consider that 10 array elements randomly fail out of 108 array elements, such as Figure 7 As shown in the figure, the black circle in the figu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a directional diagram restoration method after array element failure of broadband wide-angle scanning phased-array antenna. The directional diagram repairing method comprises the following steps: assigning 0 to a related failure array element weight coefficient; calculating an array directional diagram function of the broadband wide-angle scanning phased-array antenna afterarray element failure, and aiming at the problem of linear array failure, selecting a peak sidelobe level in a reconstruction directional diagram of each frequency point by a fitness function; performing repairing after the area array fails, and selecting the accumulated value of the peak sidelobe level corresponding to each frequency point reconstruction directional diagram as a fitness function; optimizing the remaining intact array element excitation by using a brainstorm optimization algorithm; and taking the solved optimal individual variable value as the excitation weight of the remaining effective array elements to obtain a restored array directional diagram result, and evaluating the array performance according to the repaired array directional diagram result. According to the method, under the condition that the array elements are not replaced, the array with part of array elements failing is restored, and the restoration cost is reduced; and a brain storm optimization algorithm is introduced, so that a globally optimal solution of an optimization problem can be obtained more easily.

Description

technical field [0001] The invention relates to a pattern repairing technology, in particular to a method for reconstructing and repairing a pattern of a wide bandwidth angular scanning phased array antenna element failure. Background technique [0002] Wide bandwidth angular scanning phased array antennas are widely used today because of their relatively wide bandwidths and the ability to multiplex antennas. [0003] However, the antenna unit may fail at any time during system operation. A failed array element will cause the performance of the array to degrade, and in severe cases, the array pattern will be distorted, which is mainly reflected in the sharp increase of the side lobe level. At present, the method of replacing the array elements is often used for compensation. Although the direct replacement of the failed unit has the best compensation effect, it is sometimes difficult or even impossible to achieve. Contents of the invention [0004] The purpose of the pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/20G06K9/62H01Q21/00H01Q3/30G06F111/08
CPCG06F30/20H01Q21/00H01Q3/30G06F2111/08G06F18/23213
Inventor 陈如山樊振宏丁大志顾鹏飞秦安琪
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com