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Same-frequency confocal LED lighting source structure for detecting three-dimensional defects on surface of product

A technology of LED lighting and the same frequency, applied in the direction of using optical devices, measuring devices, optical testing flaws/defects, etc., can solve the problems of poor heat dissipation, insufficient lighting light source, etc., to achieve high overall stability, good lighting effect, Low calorific value

Pending Publication Date: 2021-01-22
江苏善果缘智能科技有限公司
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to overcome the problem of insufficient bright spots of the lighting source and poor heat dissipation during the scanning and sampling process of the existing CCD sensor

Method used

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  • Same-frequency confocal LED lighting source structure for detecting three-dimensional defects on surface of product
  • Same-frequency confocal LED lighting source structure for detecting three-dimensional defects on surface of product
  • Same-frequency confocal LED lighting source structure for detecting three-dimensional defects on surface of product

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Embodiment Construction

[0033] The present invention will be further described below in conjunction with the accompanying drawings.

[0034] Such as Figure 1-Figure 5 As shown, the same-frequency confocal LED lighting source structure for product surface three-dimensional defect detection of the present invention includes a sampling lens assembly 1, an LED lighting source assembly 2 and an adjustable lighting position bracket 3,

[0035] The LED lighting source assembly 2 is installed on the rear end of the sampling lens assembly 1 through an adjustable lighting position bracket 3,

[0036] The LED lighting source assembly 2 is a confocal LED lighting source with the same frequency, and the LED lighting beads inside can be turned on or off under single-point control. The unit lights up or goes out sequentially according to the clock frequency of the linear array CCD sensor pixel points sequentially exposed along the working direction, so that the LED lighting source assembly 2 and the linear array ...

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Abstract

The invention discloses a same-frequency confocal LED lighting light source structure for detecting three-dimensional defects on the surface of a product. The light surface structure is high in reliability of fixation with a lens assembly, convenient to adjust the lighting focal length of an LED lighting light source, capable of instantaneously lightening LED lamp beads, capable of being overloaded, remarkably improved in brightness, capable of being synchronously and sequentially lightened with pixels of a linear array CCD sensor, while the lighting requirement is met, energy consumption is greatly reduced, the service life is prolonged, the confocal working process is achieved through the original optics, the product surface (especially textiles) detection sampling accuracy is greatly improved, accurate original data can be conveniently provided for subsequent image processing and analysis, the CCD sensor can be conveniently used in cooperation, control is convenient, the LED lamp bead which does not need to be matched with a heat dissipation unit and can be lightened instantly can be lightened in an overload mode, the service life is not affected, the heat dissipation requirement can be met through an aluminum circuit substrate, design is ingenious, the concept is novel, and good application prospects are achieved.

Description

technical field [0001] The invention relates to the technical field of product surfaces, in particular to a structure of a co-frequency confocal LED lighting source for detecting three-dimensional defects on the product surface. Background technique [0002] CCD sensor, made of a high-sensitivity semiconductor material, can convert light into electric charge, and convert it into digital signal through analog-to-digital converter for computer to process it. At present, CCD sensors have been widely used in the detection of surface defects of industrial products. Especially for the detection of various defects on the product surface. [0003] In the detection process of product surface defects (with high precision requirements), the sampling environment is very important, and reliable and high-precision data must be provided for the subsequent image processing process to obtain accurate defect detection results. [0004] According to the different types of product surface def...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/88G01B11/25
CPCG01N21/01G01N21/88G01B11/2518G01N2021/0112
Inventor 周维郑步笑徐存辉陈立新
Owner 江苏善果缘智能科技有限公司
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