MEMS accelerometer turntable-free calibration method based on improved fruit fly optimization algorithm

A fruit fly optimization algorithm, accelerometer technology, applied in the direction of velocity/acceleration/shock measurement, testing/calibration of velocity/acceleration/shock measurement equipment, calculation, etc. , to achieve the effect of fast running speed, high solution accuracy and good algorithm stability

Active Publication Date: 2021-01-05
NAVAL AVIATION UNIV
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Problems solved by technology

The above-mentioned disclosed invention patent involves solving the Hessian matrix and matrix inversion operation when solving the accelerometer parameters. The calculation is relatively complicated and prone to matrix singularity problems, resulting in unsolvable problems
Chinese invention patent CN106597020A (No. 05 Research Institute of China Shipbuilding Ind

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  • MEMS accelerometer turntable-free calibration method based on improved fruit fly optimization algorithm
  • MEMS accelerometer turntable-free calibration method based on improved fruit fly optimization algorithm
  • MEMS accelerometer turntable-free calibration method based on improved fruit fly optimization algorithm

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[0019] In order to make the purpose, content and advantages of the present invention easier for professionals to understand and apply, the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments. However, it should be understood that the examples given here are only used to further explain the present invention, and are not intended to limit the present invention.

[0020] The MEMS accelerometer non-turntable calibration method based on the improved fruit fly optimization algorithm provided by the embodiment of the present invention, its calibration flow chart is as follows figure 1 As shown, it specifically includes the following steps:

[0021] 1) Build an accelerometer output model in a given coordinate system

[0022] During the working process of the MEMS accelerometer, its actual output value is not equal to the acceleration input value, and there is a certain error between the two. The errors include acc...

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Abstract

The invention relates to the technical field of micro inertial measurement device parameter calibration, discloses an MEMS accelerometer turntable-free calibration method based on an improved fruit fly optimization algorithm, and mainly aims to solve the problem of accelerometer parameter turntable-free calibration by applying an improved swarm intelligence optimization algorithm. An accelerometeroutput model is established according to an MEMS accelerometer error form and a defined coordinate system, and an accelerometer input and output equation is established through multi-position staticobservation. A nonlinear equation set solving problem containing accelerometer calibration parameters is converted into a nonlinear function optimization problem by utilizing a modular observation principle. Directed at the defects that only positive parameters can be searched and the search step length is fixed in a classic fruit fly optimization algorithm, a taste concentration judgment value and the search step length are improved, so that the improved fruit fly optimization algorithm has two properties of global parameter search and variable step length. And the improved fruit fly optimization algorithm is applied to a nonlinear function containing to-be-calibrated parameters of the accelerometer, and optimization solution is carried out on the to-be-calibrated parameters.

Description

technical field [0001] The invention relates to the technical field of parameter calibration of micro-inertial measurement devices, in particular to a MEMS accelerometer calibration method without a turntable based on an improved fruit fly optimization algorithm. Background technique [0002] In recent years, with the continuous development of Micro-Electro-Mechanical Systems (MEMS), more and more inertial MEMS measurement components have begun to appear in the field of personal consumption, and have gradually attracted the attention of consumers and engineers and technicians. Despite the advantages of small size and low cost, MEMS accelerometer also has the disadvantage of low measurement accuracy, which has become an important factor restricting its development. [0003] There are two main directions for improving the measurement accuracy of MEMS accelerometers at this stage. One is to improve the manufacturing and packaging accuracy of MEMS devices; the other is to calibr...

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Application Information

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IPC IPC(8): G01P21/00G06N3/00
CPCG01P21/00G06N3/006
Inventor 戴洪德郑伟伟郑百东戴邵武王希彬王瑞
Owner NAVAL AVIATION UNIV
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