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CMOS image sensor test system and method

An image sensor and test system technology, applied in image communication, television, electrical components, etc., can solve problems such as low test process efficiency, and achieve the effect of flexible adjustment of test tasks, high test efficiency, and improved flexibility

Pending Publication Date: 2021-01-01
CHENGDU LIGHT COLLECTOR TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to provide a CMOS image sensor testing system and method, which is used to solve the problem of low efficiency of the testing process in the prior art

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  • CMOS image sensor test system and method

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Embodiment Construction

[0050]The specific implementation manner of the present invention will be described in more detail below with reference to schematic diagrams. The advantages and features of the present invention will be more apparent from the following description. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0051] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right" etc. is based on the orientation or positional relationship shown in the drawings , is only for the convenience of describing the present invention and simplifying the description, but does not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orient...

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Abstract

The invention discloses a CMOS image sensor testing system and method, and the system comprises a central processing node and a plurality of test nodes, and employs a star-shaped network structure similar to the center and edges to carry out the testing of a CMOS image sensor. The test items of each test node can be flexibly configured through the central processing node, the nodes do not influence each other, and the test efficiency is high. Through the arrangement of the distributed test machine, a traditional serial or limited parallel chip test scheme is improved into a star-shaped networkdistributed test scheme with infinite nodes, the problem of test interruption caused by faults of the traditional serial machine is avoided, meanwhile, different test nodes can realize different testitems, and the test flexibility and the test efficiency are improved. When a certain test node fails, the test process of other test nodes is not influenced. The number of the test nodes can be flexibly increased or decreased, the test cost and the test speed can be flexibly adjusted, the test task can be flexibly adjusted, and the robustness is high.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a CMOS image sensor testing system and method. Background technique [0002] A CMOS image sensor (CIS, CMOS Image Sensor) is a typical solid-state imaging sensor, and has a common historical origin with a CCD (Charge-Coupled Device, charge-coupled device). A CMOS image sensor is usually composed of several parts such as image sensor array, row driver, column driver, timing control logic, AD converter, data bus output interface, control interface, etc. These parts are usually integrated on the same silicon chip. Its working process can generally be divided into several parts: reset, photoelectric conversion, integration, and readout. Due to the relatively superior performance of CMOS image sensors, such as random window reading capability, strong radiation resistance, low system complexity, and high reliability, CMOS image sensors have been widely used in other fields such as dig...

Claims

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Application Information

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IPC IPC(8): H04N17/00
CPCH04N17/002
Inventor 宋博于奇李靖王勇
Owner CHENGDU LIGHT COLLECTOR TECH
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