Adjustable power supply of integrated circuit test board and integrated circuit test board

An integrated circuit and test board technology, applied in the field of adjustable power supply and integrated circuit test board, can solve the problem of unstable power supply voltage output, and achieve the effect of solving the output instability, the purpose and advantages are simple and easy to understand, and the output is stable

Pending Publication Date: 2020-12-22
HANGZHOU CHANGCHUAN TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The embodiment of the present application provides an adjustable power supply of the integrated circuit test board and the integrated circuit test board, so as to at least solve the problem of unstable output of the power supply voltage of the integrated circuit test board in the related art

Method used

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  • Adjustable power supply of integrated circuit test board and integrated circuit test board
  • Adjustable power supply of integrated circuit test board and integrated circuit test board
  • Adjustable power supply of integrated circuit test board and integrated circuit test board

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Embodiment Construction

[0023] In order to make the purpose, technical solutions, and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described and illustrated below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the embodiments of the present application, and are not intended to limit the embodiments of the present application. Based on the embodiments provided in the embodiments of the present application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the embodiments of the present application.

[0024] Apparently, the accompanying drawings in the following description are only some examples or embodiments of the embodiments of the present application, and those skilled in the art can also apply the present application according to these d...

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Abstract

The invention relates to an adjustable power supply of an integrated circuit test board and the integrated circuit test board. The adjustable power supply of the integrated circuit test board comprises a controller and at least two power supply modules, wherein the at least two power supply modules are connected in series on an output end of the controller in a daisy chain topological structure, the power supply module comprises an adjusting assembly, a first DCDC power supply and a second DCDC power supply, an input end of the adjusting assembly is electrically connected with the output end of the controller, a first output end of the adjusting assembly is electrically connected with the feedback input end of the first DCDC power supply, a second output end of the adjusting assembly is electrically connected with the feedback input end of the second DCDC power supply, the adjusting assembly is used for adjusting the output voltage of the first DCDC power supply and the output voltageof the second DCDC power supply according to the control signals outputted by the controller. According to the adjustable power supply, a problem that the output of the power supply voltage of the integrated circuit test board is unstable in the prior art is solved, and the technical effect of ensuring the stable output of the adjustable power supply voltage of the integrated circuit test board isrealized.

Description

technical field [0001] The embodiment of the present application relates to the technical field of integrated circuits, in particular to an adjustable power supply of an integrated circuit test board and the integrated circuit test board. Background technique [0002] Integrated Circuit (Integrated Circuit, referred to as IC); as the name implies, it is a certain number of commonly used electronic components, such as resistors, capacitors, transistors, etc. circuit. [0003] After the integrated circuit design is completed, it needs to be tested for its function and electrical characteristics. The test content includes the functional test (Functional Test, referred to as FT) and electrical characteristic test (Circuit Probing, referred to as CP) of the entire integrated circuit chip, as well as integrated circuit testing. Reliability test of whether the current, voltage, and frequency of the chip are stable in a high-temperature environment. At present, the integrated circ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/28H02M3/00H02M1/14
CPCG01R1/28G01R31/2851H02M1/14H02M3/00H02M1/0003H02M1/0074
Inventor 杨钊辉钟锋浩袁晓航
Owner HANGZHOU CHANGCHUAN TECH CO LTD
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