Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition

An accelerated degradation test and failure mode technology, applied in manufacturing computing systems, design optimization/simulation, special data processing applications, etc., can solve problems such as increased degradation amount or degradation rate, increased degradation rate, increased degradation amount, etc., to achieve improved Effects of Product Lifetime and Reliability Assessment

Active Publication Date: 2020-12-11
NAT UNIV OF DEFENSE TECH
View PDF2 Cites 24 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, many scholars have studied the one-sided dependence between stochastic shock-degradation, that is, the stochastic shock process will lead to an increase in the amount of degradation or an increase in the degradation rate
However, in engineering, the degradation and impact process are not only unilaterally dependent, but interdependent, that is, each random impact load will lead to an increase in the amount of degradation or degradation rate, and the impact strength will gradually increase under the accumulation of degradation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition
  • Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition
  • Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0064] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0065] The statistical analysis method of accelerated degradation test under multi-stress and multi-failure mode dependent competition conditions includes the following steps:

[0066] Step 1: Obtain product multi-stress accelerated degradation test data. The multi-stress accelerated degradation test data is obtained by performing accelerated degradation experiments on multiple products under multiple stresses combined with multiple degradation failure mode test times.

[0067] Specifically, design a multi-stress accelerated degradation test plan, select an appropriate acc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an accelerated degradation test statistical analysis method under a multi-stress multi-failure mode dependent competition condition. The method comprises the following steps: acquiring multi-stress accelerated degradation test data of a product; selecting a proper distribution model and estimating distribution parameters; establishing a model between the degradation amount distribution parameter and time and estimating a model parameter; constructing a multi-stress acceleration model; modelling multi-failure-mode dependent competitive reliability; and solving unknown parameters of the model to obtain product reliability distribution. The coupling influence of multiple stresses on life characteristics and the dependency of a degradation process and a random impact process are considered, a reliability function under the N stress M failure mode dependency competition condition is established, and the gap in the related research field is filled; based on product degradation amount distribution and a multi-stress multi-failure-mode dependent competition reliability model, an analysis method of an N-stress M-failure-mode dependent competition accelerated degradation test is established systematically for the first time, engineering practice is better met, the service life of a product is prolonged, and the accuracy of reliability evaluation is improved.

Description

technical field [0001] The invention belongs to the technical field of reliability engineering, and in particular relates to a statistical analysis method for accelerated degradation tests under multi-stress and multi-failure mode dependent competition conditions. Background technique [0002] Under the constraints of time and cost, life prediction technology based on accelerated degradation test has become an inevitable requirement to analyze and solve the reliability of high-reliability and long-life products. However, products are usually subjected to various stresses during actual service, including working stress (such as mechanical load, current, voltage, etc.) and environmental stress (such as temperature, vibration, shock, etc.). Therefore, the traditional accelerated degradation test with a single stress cannot truly reflect the actual stress state of the product. Studying the statistical analysis method of the accelerated degradation test of the product under the c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/20G06F111/08G06F119/02G06F119/14
CPCG06F30/20G06F2111/08G06F2119/02G06F2119/14Y02P90/30
Inventor 刘尧汪亚顺范政伟李兴格张书锋陈循
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products