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Multi-parameter related degraded product reliability evaluation method considering multi-source uncertainty

An uncertainty and multi-parameter technology, applied in the field of reliability evaluation of multi-parameter related degraded products considering multi-source uncertainties, can solve the problems of lack of rationality and accuracy of reliability evaluation results, and achieve a simple and efficient evaluation process. Improve the accuracy and applicability, the effect of accurate and reasonable results

Active Publication Date: 2021-07-09
HARBIN INST OF TECH
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Problems solved by technology

[0004] The purpose of the present invention is to solve the impact of multi-source uncertainty (randomness of the degradation process, variability between sample individuals and measurement errors) and the nonlinearity of the degradation process in the existing multi-parameter correlation degradation model, Further lead to the lack of rationality and accuracy of the reliability evaluation results, the present invention provides a multi-parameter correlation degradation product reliability evaluation method considering multi-source uncertainty

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  • Multi-parameter related degraded product reliability evaluation method considering multi-source uncertainty
  • Multi-parameter related degraded product reliability evaluation method considering multi-source uncertainty
  • Multi-parameter related degraded product reliability evaluation method considering multi-source uncertainty

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specific Embodiment approach 1

[0022] Specific Embodiment 1: This embodiment provides a method for evaluating the reliability of multi-parameter related degradation products considering multi-source uncertainties. The method first designs a reasonable accelerated degradation test by analyzing the task profile and failure mechanism of the product, And measure the multivariate performance parameters of the product; then, for the degradation data of a single performance parameter, establish and consider multi-source uncertainties (randomness of the degradation process, differences between sample individuals, and measurement errors) and non-linearity of the degradation process. Linear edge degradation model, and in the case of a given failure threshold, with the help of the concept of first arrival time (the time when the performance degradation reaches the failure threshold for the first time), approximate analytical forms of failure probability density function and failure distribution function are derived; the...

specific Embodiment approach 2

[0047] Specific implementation mode two: the following combination Figure 1 to Figure 5 Describe this embodiment. This embodiment is a further description of the specific embodiment 1. In this embodiment, a certain type of film capacitor is used as an object to evaluate the reliability of multi-parameter correlation degradation considering multi-source uncertainties. The specific steps are as follows:

[0048] Step 1: By analyzing the task profile and failure mechanism of a certain type of film capacitor, using voltage and temperature as the accelerated stress, put 5 samples into the accelerated degradation test, and continuously measure the capacitance and equivalent series resistance of the 5 film capacitors ( ESR), the degradation trajectories of the two performance parameters are as follows figure 2 and image 3 shown;

[0049] Step 2: For the capacitance value and ESR, respectively establish an edge degradation model Y that considers multi-source uncertainty (randomne...

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Abstract

The invention discloses a multi-parameter related degraded product reliability evaluation method considering multi-source uncertainty, and belongs to the technical field of product performance degradation modeling and reliability evaluation. The method comprises the following steps: analyzing a mission profile and a failure mechanism of a product, designing an accelerated degradation test, and measuring multi-element performance parameters of the product; aiming at degradation data of a single performance parameter, establishing an edge degradation model which considers multi-source uncertainty and degradation process nonlinearity at the same time, and deducing an approximate analysis form of a failure probability density function and a failure distribution function under the condition that a failure threshold value is given; establishing a joint failure distribution function of each performance parameter by using a Copula function; and obtaining each edge degradation model and an unknown parameter set in the Copula function by using maximum likelihood estimation to realize product reliability evaluation. According to the method, the problem that the reliability evaluation result lacks rationality due to the fact that influences of multi-source uncertainty and degradation process nonlinearity are not considered at the same time in an existing multi-parameter related degradation model is solved.

Description

technical field [0001] The invention belongs to the technical field of product performance degradation modeling and reliability evaluation, and in particular relates to a multi-parameter correlation degradation product reliability evaluation method considering multi-source uncertainties. Background technique [0002] With the continuous development of science and technology and manufacturing level, contemporary products, from complex systems or equipment to components or components, mostly present the characteristics of "high reliability and long life", which makes it difficult to predict or evaluate their reliability indicators in conventional life tests . Accelerated degradation test can significantly shorten the test period by increasing the stress level under the premise of ensuring that the failure mechanism of the product remains unchanged. At the same time, it can obtain rich information on the degradation of product performance parameters, which provides strong suppo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F119/02G06F119/04
CPCG06F30/20G06F2119/02G06F2119/04
Inventor 叶雪荣胡义凡郑博恺陈岑冯睿刘思瑞张东翟国富
Owner HARBIN INST OF TECH
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