Local leakage current density threshold determination method and device and computer equipment

A technology of density threshold and leakage current value, applied in computing, photovoltaic power generation, electrical components, etc., can solve the problems of inaccurate hot spot temperature test results, inaccurate photovoltaic cell test results, etc., to improve detection accuracy and detection. The effect of efficiency

Pending Publication Date: 2020-12-04
JINKO SOLAR CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Subsequent laser scribing once or even multiple times may cause new leakage, resulting in inaccurate test results of hot spot temperature, and inaccurate test results of photovoltaic cells

Method used

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  • Local leakage current density threshold determination method and device and computer equipment
  • Local leakage current density threshold determination method and device and computer equipment
  • Local leakage current density threshold determination method and device and computer equipment

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Embodiment Construction

[0039] In order to better understand the technical solutions of the present invention, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0040] It should be clear that the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0041] Terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. As used in the embodiments of the present invention and the appended claims, the singular forms "a", "said" and "the" are also intended to include the plural forms unless the context clearly indicates otherwise.

[0042] It should be understood that the term "an...

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Abstract

According to the technical scheme of the method and device for determining the local area leakage current density threshold value and the computer equipment, a plurality of test battery pieces are obtained, multiple reverse bias voltages are applied to each test battery piece through an EL tester, the leakage current value and an EL image corresponding to each reverse bias voltage are obtained, acorresponding relation between the local leakage current density and the hot spot temperature of each test battery piece is determined according to the EL image corresponding to each test battery piece, a local leakage current density threshold value is determined according to the corresponding relation between the local leakage current density and the hot spot temperature of the plurality of testbattery pieces and the obtained hot spot temperature limit value, whether the photovoltaic cell is qualified or not is detected through the local leakage current density threshold value, so that thedetection accuracy and the detection efficiency of the photovoltaic cell are improved.

Description

【Technical field】 [0001] The invention relates to the technical field of photovoltaic power generation, in particular to a method, device and computer equipment for determining a local leakage current density threshold. 【Background technique】 [0002] In the related art, for verifying whether the photovoltaic cell is qualified, it is usually used to detect whether the hot spot temperature of the photovoltaic cell is qualified, so as to select the unqualified photovoltaic cell and make the qualified photovoltaic cell into a photovoltaic module. However, at present, when testing the leakage of conventional cells, the leakage is usually tested on the whole cell, and the standard generally accepted in the industry is that the leakage current is ≤1A. With the continuous improvement of battery efficiency and size, the current of the battery sheet reaches 11A or even exceeds 12.5A. Subsequent laser scribing once or even multiple times may cause new leakage, resulting in inaccurate...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/62G01R31/52H02S50/15
CPCG06T7/0004G06T7/62G01R31/52H02S50/15G06T2207/30148Y02E10/50
Inventor 于琨刘长明张昕宇黄纪德夏志鹏
Owner JINKO SOLAR CO LTD
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