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Small sample picture classification model and method based on semantic auxiliary attention mechanism

A technology of image classification and sample images, applied in computer parts, character and pattern recognition, instruments, etc., can solve the problems of areas susceptible to the influence of the external environment, ambiguity, and classification tasks, and achieve good classification of small sample images. , the effect of improving performance

Pending Publication Date: 2020-11-24
CHENGDU KOALA URAN TECH CO LTD
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AI Technical Summary

Problems solved by technology

[0007] Traditional embedding and measurement algorithms have fuzzy problems in feature embedding, which leads to deviations in the representation of class centers, which has a negative impact on classification tasks
This ambiguity problem is mainly because the traditional convolutional neural network structure focuses on areas that are easily affected by the external environment.

Method used

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  • Small sample picture classification model and method based on semantic auxiliary attention mechanism
  • Small sample picture classification model and method based on semantic auxiliary attention mechanism
  • Small sample picture classification model and method based on semantic auxiliary attention mechanism

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Embodiment

[0076] In the embodiment of the present invention, a small-sample image classification model based on a semantic-assisted attention mechanism is taken as an example to describe in detail. The overall structure of the module is as follows figure 2 shown. The module consists of two branches: a spatial attention mechanism and a semantic alignment mechanism. Suppose our input feature map is The module aims to generate masks for it, that is, a semantically assisted attention map Therefore, suppose the output feature map is Calculate according to the following formula:

[0077]

[0078] in, is a bitwise multiplication operation that applies the attention value to the input feature map.

[0079] The spatial attention mechanism aims to mine the internal spatial associations of the features of the input feature map. In other words, it helps the model determine where to focus on the input feature map, highlights key regional features in the input feature map, suppresses u...

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Abstract

The invention discloses a small sample picture classification model and method based on a semantic auxiliary attention mechanism, and belongs to the field of small sample picture classification in computer vision. The system comprises a convolutional neural network, an extension model for zero sample picture classification, a spatial attention module and a semantic alignment module. The method comprises the following steps: selecting a training data set; constructing a network structure of the small sample picture classification model based on the semantic aided attention mechanism; preprocessing the training data, dividing the training data into a training set, a verification set and a test set, and subdividing each sub-data set into data packets including a support set and a test set; training a small sample picture classification model; and verifying the small sample picture classification model. According to the method, an attention mechanism and a multi-module learning principle are combined, the method is divided into two sub-modules, namely a spatial attention module and a semantic alignment module, the method can focus on a local area, and better small sample picture classification can be realized.

Description

technical field [0001] The invention belongs to the field of small-sample picture classification in computer vision, and in particular relates to a small-sample picture classification model and method based on a semantic-assisted attention mechanism. Background technique [0002] Few-shot learning aims to solve how to carry out effective machine learning in the case of few samples. Few-shot learning is closer to human learning mode and has high academic and industrial value. Firstly, small-sample learning helps to reduce the pressure of supervised data collection; secondly, small-sample learning helps to solve the learning problem of rare samples. Because small sample learning gets rid of the dependence on a large amount of labeled data to a certain extent, it has become one of the research hotspots in the field of artificial intelligence in recent years. [0003] Few-shot image classification is a sub-application problem of the small sample learning problem, which aims to...

Claims

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Application Information

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IPC IPC(8): G06K9/62
CPCG06F18/2411G06F18/214
Inventor 徐行徐贤达沈复民贾可申恒涛
Owner CHENGDU KOALA URAN TECH CO LTD
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