Nor Flash programming method, Nor Flash modeling method and storage and calculation integrated chip

A programming method and a technology for programming circuits, which are applied in the field of NorFlash-based memory-computing integrated chips, can solve the problems of adding programming and not being able to meet the requirements of memory-computing integrated chips.

Active Publication Date: 2020-11-17
BEIJING ZHICUN WITIN TECH CORP LTD
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the present invention provides a Nor Flash programming method and device, a modeling method, a Nor Flash-based storage and calculation integrated chip, and a computer-readable storage medium, so as to solve the problem that the existing programming method cannot meet the requirements of the Nor Flash-based storage and calculation integration. Chip requirements lead to increased programming complexity, delay and power consumption overhead

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  • Nor Flash programming method, Nor Flash modeling method and storage and calculation integrated chip
  • Nor Flash programming method, Nor Flash modeling method and storage and calculation integrated chip
  • Nor Flash programming method, Nor Flash modeling method and storage and calculation integrated chip

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Embodiment Construction

[0063] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0064] Those skilled in the art should understand that the embodiments of the present invention may be provided as methods, systems, or computer program products. Accordingly, the present invention can take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermor...

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Abstract

The invention provides an Nor Flash programming method, an Nor Flash modeling method and a storage and calculation integrated chip. The Nor Flash programming method comprises the steps of judging whether an absolute value of a difference value between a target current of a flash memory unit and a current is greater than a preset threshold value or not; if so, judging whether the current is largerthan the target current or not; if the current current is greater than the target current, obtaining a write-in voltage according to the current current, the target current and a write-in voltage model, and controlling a programming circuit to apply the write-in voltage to the flash memory unit; if the current current is smaller than the target current, obtaining an erase voltage according to thecurrent current, the target current and an erase voltage model, and controlling a programming circuit to apply the erase voltage to the flash memory unit, i.e., directly obtaining a write-in voltage or an erase voltage by utilizing a write-in voltage model or an erase voltage model, and removing a repeated iteration process of updating and checking.

Description

technical field [0001] The invention relates to the field of semiconductor technology, in particular to a Nor Flash programming method, a modeling method, and a Nor Flash-based storage-computing integrated chip. Background technique [0002] When Nor Flash is used as a memory (only for storing data), the data stored in each unit is generally 1 to 4 bits. Therefore, the maximum number of states for each unit is 2 to 16. The programming method is relatively simple, and the update- The iterative method of update-and-verify is programmed to ensure that the final state is consistent with the target state. The specific process is as follows: Assuming that the initial state is a fully deleted state (that is, there is no electron in the floating gate), each write (injection electrons), read its current, if the current read current is greater than the target current, continue to write (inject electrons), and then check the relationship between the read current and the target current;...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/10G11C16/14
CPCG11C16/105G11C16/14
Inventor 王绍迪
Owner BEIJING ZHICUN WITIN TECH CORP LTD
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