Model training method and device and defect detection method and device

A model training and defect technology, applied in the computer field, can solve the problem of high detection false positive rate

Pending Publication Date: 2020-10-30
HANGZHOU HIKVISION DIGITAL TECH
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present application provides a defect detection method and d...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Model training method and device and defect detection method and device
  • Model training method and device and defect detection method and device
  • Model training method and device and defect detection method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0045] The terminology used in this application is for the purpose of describing particular embodiments only, and is not intended to limit the application. As used in this application and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the term...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a model training method and device. The model training method comprises the steps: acquiring multiple frames of training samples with labels, wherein the labels at least comprise a first label and a second label, and the first label is used for recording a marked first area in the training samples as an area prone to false detection, and the second label is used for recording a marked second area in the training samples as an area with defects; and training a detection model for detecting defects by utilizing the training samples with the labels and the position information of the first areas and the position information of the second areas in the training samples. By adding the labels of the areas prone to false detection, learning of features of the areas prone tofalse detection can be enhanced according to the added labels and positions of the areas prone to false detection when the model is trained, and the false detection rate of the detection model is reduced, and the detection accuracy of the detection model is improved.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to a model training method and device, and a defect detection method and device. Background technique [0002] In industrial production, it is necessary to perform defect detection (ASI, Automated Surface Inspection) on the produced products. For example, after the textile industry produces cloth, it is necessary to detect whether there are flaws or defects in the cloth, so as to facilitate timely repair and improve the quality of the cloth. Although there are many kinds of traditional defect detection methods, they either have poor detection results, or have a large amount of calculation and low efficiency. [0003] At present, the defect detection is carried out by using the neural network based on deep learning, but the false detection rate is relatively high. Contents of the invention [0004] In view of this, the present application provides a defect detection m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06T7/00G06T7/77
CPCG06T7/0008G06T7/77G06T2207/20081G06T2207/20084G06T2207/30124G06T7/00
Inventor 陈佳伟
Owner HANGZHOU HIKVISION DIGITAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap