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Improved Niblack infrared image segmentation method combining maximum entropy

An infrared image and maximum entropy technology, applied in the field of image processing, can solve problems such as threshold selection difficulties, under-segmentation, and image over-segmentation, and achieve the effects of strong robustness, noise elimination, and good definition

Active Publication Date: 2020-08-25
XI'AN POLYTECHNIC UNIVERSITY
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Problems solved by technology

[0004] The purpose of the present invention is to provide a joint maximum entropy improved Niblack infrared image segmentation method, which solves the problem of over-segmentation or over-segmentation of the image due to difficulty in threshold selection under complex lighting conditions. under-segmentation problem

Method used

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  • Improved Niblack infrared image segmentation method combining maximum entropy
  • Improved Niblack infrared image segmentation method combining maximum entropy
  • Improved Niblack infrared image segmentation method combining maximum entropy

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Embodiment

[0099] For the infrared image of the knife switch fault, such as figure 2 As shown, the segmentation results of Niblack method, Otsu method and maximum entropy method are as follows image 3 , Figure 4 , Figure 5 As shown, the target part is not completely divided, and the final graph is relatively messy. Adopt the method processing result of the present invention as Image 6 As shown in Fig. 1, it shows that this method can completely divide the fault area, and there are fewer misclassified areas, and the segmentation result of the target area is more accurate.

[0100] Table 1 Quantitative evaluation comparison of segmentation results

[0101]

[0102] From the comparison of the data in Table 1, it can be seen that the segmentation results of the method in this paper are closest to the standard segmentation graphics, with an average overlapping area of ​​82.53% and an average misclassification rate of 1.75%. That is, the target area can be relatively completely se...

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Abstract

The invention discloses a maximum entropy combined improved Niblet infrared image segmentation method, which is specifically implemented according to the following steps: step 1, inputting an originalimage, and performing median filtering denoising preprocessing on the original image; step 2, improving a neighborhood window and a correction coefficient in a Niblet method to obtain a local threshold TNiblack; step 3, carrying out threshold weighting on the optimal threshold TKapur and the local threshold TNiback obtained by the maximum entropy method, and determining the optimal threshold of segmentation; step 4, segmenting the image subjected to denoising preprocessing in the step 1 through an optimal threshold value. The problem of image over-segmentation or under-segmentation caused bydifficulty in threshold selection under the condition of complex illumination is solved.

Description

technical field [0001] The invention belongs to the technical field of image processing and relates to an improved Niblack infrared image segmentation method combined with maximum entropy. Background technique [0002] At present, in the maintenance and maintenance of power equipment, using infrared thermal imaging technology to diagnose the fault of the equipment under test is a relatively wide method, and has become a routine method in the field of power equipment diagnosis. Effectively segmenting the infrared image of power equipment and extracting the fault area from the infrared image is a key link in the intelligent diagnosis of power equipment faults. However, in the actual infrared image acquisition process, the image is easily affected by its own imaging system and the complex environment background of the target, which makes the collected infrared image have problems such as complex background and large noise, which undoubtedly brings a lot of inconvenience to the ...

Claims

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Application Information

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IPC IPC(8): G06T7/11G06T7/136G06T5/00G06T5/20
CPCG06T7/11G06T7/136G06T5/20G06T2207/10048G06T2207/20032G06T5/70
Inventor 李云红李传真周小计毕远东张轩刘旭东
Owner XI'AN POLYTECHNIC UNIVERSITY
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