TEC-based thermal infrared imager automatic correction method and device

An infrared thermal imager and automatic correction technology, which is used in measuring devices, instruments, scientific instruments, etc., to achieve the effects of simple processing, good temperature adaptability, and simple operation

Active Publication Date: 2020-08-21
北京富吉瑞光电科技股份有限公司
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  • Abstract
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Problems solved by technology

The invention provides a TEC-based automatic calibration method and device for an infrared thermal imager, which effectively solves the problem of the calibration effect of an infrared thermal imager in a high and low temperature environment

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  • TEC-based thermal infrared imager automatic correction method and device
  • TEC-based thermal infrared imager automatic correction method and device

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.

[0037] like figure 1 The TEC-based infrared camera automatic calibration device shown includes a TEC baffle, a drive motor, a temperature sensor and a processing circuit.

[0038] The TEC baffle is arranged between the lens and the detector, and can be rotated under the drive of the drive motor to switch between the first position and the second position, and block the detector and the infrared camera lens in the first p...

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Abstract

The invention relates to a TEC-based thermal infrared imager automatic correction method and device. The method comprises the steps of: in a calibration process of the thermal infrared imager, measuring a suspected pixel of the thermal infrared imager in each temperature range, adopting the suspected pixel existing in each temperature range as a dead point, and enabling the rest suspected pixels to serve as unstable pixels of each temperature point; in the using process, acquiring an image of the thermal infrared imager by a processing circuit, completing non-uniformity correction, acquiring the dead point position and acquiring a current temperature; searching an unstable pixel according to the current temperature; directly compensating the dead point position in the image; and judging whether the unstable pixel is a blind pixel or not, if so, performing compensation, and otherwise, not performing processing. According to the method, dead point and unstable pixel calibration is carried out on all temperature points, meanwhile, non-uniformity correction is completed, in the using process, blind pixel judgment does not need to be carried out on each image, corresponding compensationmethods are directly adopted for dead points and unstable pixels for compensation, processing is easy, and the real-time performance is good.

Description

technical field [0001] The invention relates to the technical field of infrared image processing, in particular to a TEC-based automatic calibration method and device for an infrared camera. Background technique [0002] Due to the inhomogeneity of the semiconductor material used to make the infrared detector, the level of technology, the inhomogeneity of the dark current, the inhomogeneity of the readout circuit, and the ambient temperature, the pixel response of the infrared detector is related to the amount of infrared radiation. It presents a complex nonlinear relationship, which leads to blurred output images of infrared thermal imaging cameras, reduced image quality, and fixed pattern noise, which seriously affects device performance. [0003] At present, the commonly used correction algorithm adopts a two-point temperature calibration correction algorithm plus a one-point temperature correction algorithm. The two-point calibration will be calibrated and stored in the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00G01J5/80
Inventor 杨宏双季云松陈德智
Owner 北京富吉瑞光电科技股份有限公司
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