A system and method for active triggering of x-ray free electron laser events

An active triggering, X-ray technology, applied in phonon exciters, electrical components, circuits, etc., can solve the problems of affecting the experimental results, limited luminescence principle, low repetition frequency, etc., to improve the experimental efficiency and ensure the success of the experiment. Effect

Active Publication Date: 2021-07-09
SHANGHAI TECH UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But the X-ray free electron laser also has some shortcomings that need to be solved. The most important thing is that the X-ray free electron laser device is very long, with a total length of several kilometers from the accelerator to the experimental station. For example, the Shanghai high repetition frequency hard X-ray free electron laser has a total length of 3.1 kilometers, the beamline alone is 1.2 kilometers long
At this time, the stability of the entire beamline optical components will greatly affect the position of the beam reaching the experimental station. At the same time, the X-ray free electron laser is limited by the principle of light emission and will also generate about 10% instability from the light source.
However, some experiments have very high requirements on the stability of the beam position. For example, some pump experiments require the X-ray free electron laser and the pump laser to be incident on the same position, and there is no very good way to judge whether they are incident on the same position at the experimental station. Thus affecting the experimental results; some experimental pump lasers have a very low repetition rate in order to achieve high power density such as hundreds of petawatts, and high-power pump lasers are very precious at this time
If the position stability of the X-ray free electron laser cannot be effectively guaranteed, the experiment will be very difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A system and method for active triggering of x-ray free electron laser events

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] Below in conjunction with specific embodiment, further illustrate the present invention. It should be understood that these examples are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the teachings of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims of the present application.

[0031] Such as figure 1 As shown, an X-ray free electron laser event active trigger system provided by the present invention includes two sets of single pulse position detectors 2, 3, a set of sample point position detectors 6, a free electron laser synchronous trigger system 9, multiple high-speed Data acquisition system 10, position analysis and event active trigger system 12, experiment trigger and detection system 11, pump...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an active triggering system for X-ray free electron laser events. The system includes two sets of single-pulse position detectors, a set of sample point position detectors, a free electron laser synchronous trigger system, a multi-channel high-speed data acquisition system, and a position analysis system. And event active trigger system, experimental trigger and detection system, pump laser and auxiliary collimated laser, attenuator and focusing mirror. The invention also provides a method for actively triggering X-ray free electron laser events. The invention can improve the experiment efficiency and ensure the success of the experiment.

Description

technical field [0001] The invention relates to an active triggering system for X-ray free electron laser events and a triggering method using the system. Background technique [0002] X-ray free-electron laser (XFEL) has the characteristics of high brightness, high coherence, and ultrashort pulse, and is a powerful tool for basic scientific research. But the X-ray free electron laser also has some shortcomings that need to be solved. The most important thing is that the X-ray free electron laser device is very long, with a total length of several kilometers from the accelerator to the experimental station. For example, the Shanghai high repetition frequency hard X-ray free electron laser has a total length of 3.1 kilometers, and the beamline alone is 1.2 kilometers long. At this time, the stability of the entire beamline optical components will greatly affect the position of the beam reaching the experimental station. At the same time, the X-ray free electron laser is limi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01S4/00G01B21/00
CPCG01B21/00H01S4/00
Inventor 佟亚军江怀东范家东
Owner SHANGHAI TECH UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products