Method and device for measuring actual reflectivity of liquid crystal device

Abstract

The invention discloses a method for measuring the reflectivity of a liquid crystal device based on a coherence principle, which comprises a light source, a beam splitter, a light intensity detector,a device reflector and a device to be measured, wherein the light source, the beam splitter, the light intensity detector, the device reflector and the device to be measured form a light path, the light source enters the liquid crystal device through the beam splitter, the reflected light of the other beam of light of the beam splitter passing through the device reflector and the liquid crystal device passes through the beam splitter again and then is measured by the light intensity detector, and the light source is a broadband light source. According to the invention, an improvement on the existing method for measuring the reflectivity of the reflective liquid crystal device is provided from the device to the method. The light source with certain wavelength distribution is adopted to enter the liquid crystal device through the beam splitter, the reflected light passes through the beam splitter again, then is measured by the light intensity detector and is subjected to Fourier transform, so that the accurate reflectivity of each reflecting layer of the liquid crystal device can be accurately and conveniently deduced and detected.

Description

technical field [0001] The invention relates to a method and a device for measuring the actual reflectivity of a liquid crystal device. Background technique [0002] figure 1 The basic structure of a reflective liquid crystal device is given, which mainly includes glass front plate, ITO common electrode, liquid crystal orientation layer, liquid crystal layer, liquid crystal orientation layer and back plate with pixel electrodes. Each part of the structure is composed of a different material with a different refractive index between the materials. Therefore, when the incident light passes through the boundary area of ​​each component, a part of it will be reflected due to the difference in refractive index. For example, the light reflected at the junction of the front glass and the ITO electrode will not enter the liquid crystal layer and be modulated by the liquid crystal, which affects the performance of the device. In order to reduce this reflection, optical coating or ...

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Problems solved by technology

Therefore, when the wavelength of the light source changes, the reflectance measurement results are also different, which makes analysis difficult

[0006] At the same time, this method cannot analyze the reflectivity at the junction area of ​​other layers, and cannot provide guidance for the optimization of device design

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