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Circuit board power supply parameter test system and method

A technology for power supply parameters and testing systems, applied in electronic circuit testing, printed circuit testing, electrical measurement, etc., can solve problems such as the limitation of the number of circuit board tests, improve efficiency and accuracy, realize safety testing, and improve efficiency.

Active Publication Date: 2020-05-12
广州京信通信科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Based on this, it is necessary to provide a circuit board power parameter test system and method for the problem that the number of circuit board tests is limited by the instrument port in the traditional circuit board power parameter test method

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  • Circuit board power supply parameter test system and method
  • Circuit board power supply parameter test system and method
  • Circuit board power supply parameter test system and method

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Embodiment Construction

[0039] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0040] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to and integrally integrated with the other element, or there may be an intervening element at the same time. The terms "port", "one end", "other end" and similar expressions are used herein for the purpose of description only.

[0041] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly und...

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Abstract

The invention relates to a circuit board power supply parameter test system and method. In the circuit board power supply parameter test system, a remote control device can be connected with a plurality of circuit board power supply parameter test devices through a network; the circuit board power supply parameter testing device can test at least one circuit board to be tested. The processing unitis connected with the remote control device and is respectively connected with a power supply interface and a functional circuit of the circuit board to be tested through a power supply parameter acquisition unit; based on the above structure, the processing unit can obtain configuration parameters and test parameters transmitted by the remote control device, and then configure the power supply parameter acquisition unit, thereby realizing the automatic test of the power supply parameters of the circuit board to be tested, and improving the test efficiency and accuracy. Based on this, the number of the circuit board power supply parameter test devices can be flexibly set according to the number and requirements of the circuit boards to be tested, multi-channel remote testing is realized,the efficiency of remote control is improved, and the measurement number of the circuit boards to be tested is prevented from being limited by the number of device ports.

Description

technical field [0001] The present application relates to the technical field of electronic equipment, in particular to a circuit board power supply parameter testing system and method. Background technique [0002] Circuit board power supply parameters (including voltage, current, and power consumption, etc.) are the most critical factors affecting reliability in electronic products. In addition to the design margin, in the later stage of product development, it is necessary to test the dynamic power supply parameters of the circuit board in operation in real time, so as to obtain the actual working power supply characteristics of the circuit board. [0003] During the implementation process, the inventors found that there are at least the following problems in the traditional technology: the traditional test method is that the circuit engineer uses multiple instruments such as an oscilloscope, a DC power supply, and a multimeter to cooperate with the test, and the number o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2803G01R31/2806
Inventor 黄威威荣丰梅黄锦汉钱文婷
Owner 广州京信通信科技有限公司
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