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Multi-parameter integration test system and method for complex electronic equipment

An electronic equipment and integrated testing technology, applied in the field of manufacturing, can solve problems such as high cost and low efficiency, achieve reliable data protection, ensure accuracy, and improve test efficiency

Inactive Publication Date: 2020-04-21
CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The invention provides a multi-parameter integrated testing system and method for complex electronic equipment to solve the problems of low efficiency and high cost of traditional testing methods in the production process of electrical equipment

Method used

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  • Multi-parameter integration test system and method for complex electronic equipment
  • Multi-parameter integration test system and method for complex electronic equipment
  • Multi-parameter integration test system and method for complex electronic equipment

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Embodiment Construction

[0042] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0043] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "back", "left" and "right" etc. indicate directions or positions The relationship is an orientation or positional relationship based on the working state of the present invention, which is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred system or element must have a specific orientation, be constructed and operated in a specific orientation, Therefore, it should not be construed as limiting the invention. In addition, the terms "first", "second", "third" and "fourth" are used for descriptive purposes only and should not ...

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Abstract

The invention discloses a multi-parameter integration test system and a multi-parameter integration test method for complex electronic equipment. The multi-parameter integration test system comprisesa test equipment set, a test tool and a main control computer, wherein the test equipment set comprises at least one set of test equipment, each set of test equipment is provided with a general test adapter interface, one end of the test equipment is connected with the main control computer, and the other end of the test equipment is connected with the test tool by means of the general test adapter interface; and the test tool is used for connecting the test equipment set and a tested piece. According to the multi-parameter integration test system and the multi-parameter integration test method, the test efficiency of the complex electronic equipment can be improved, the test cost is reduced, the precision of test result recording is ensured, and reliable data guarantee is provided for product tracing.

Description

technical field [0001] The invention relates to the field of manufacturing, in particular to a multi-parameter integrated testing system and method for complex electronic equipment. Background technique [0002] In the production process of the core components of complex electronic equipment, quality testing runs through the entire production process, including testing before components leave the warehouse for production, testing after parts are welded, and testing after the entire assembly is completed. Joint debugging test, etc. Through the test of assembly quality, it is possible to find operational problems in the product assembly stage and repair them in time to prevent greater losses; it is also possible to check the consistency and effectiveness of product assembly, improve the processing technology, and enhance the manufacturing level. [0003] At present, the Denso production line has many testing links, testing products, and testing equipment. All testing stations...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 曹亚琪张连勇冯展鹰严战非
Owner CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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