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Six-degree-of-freedom pose measurement device and method based on orthogonal binocular vision

A pose measurement and binocular vision technology, which is applied to measurement devices, camera devices, optical devices, etc., can solve the problem that the sensor cannot give six degrees of freedom measurement results at the same time, and achieve real-time measurement and reduce installation accuracy. requirements, cost reduction

Active Publication Date: 2021-03-12
BEIHANG UNIV
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  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a six-degree-of-freedom position and orientation measurement device and method based on orthogonal binocular vision, which solves the problem that traditional sensors cannot simultaneously provide six-degree-of-freedom measurement results, and achieves submicron displacement resolution and Angular resolution in the arc-second range

Method used

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  • Six-degree-of-freedom pose measurement device and method based on orthogonal binocular vision
  • Six-degree-of-freedom pose measurement device and method based on orthogonal binocular vision
  • Six-degree-of-freedom pose measurement device and method based on orthogonal binocular vision

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Embodiment Construction

[0047] The present invention will be further described in detail below with reference to the accompanying drawings.

[0048] figure 1 Structure of the measuring apparatus provided by the present invention. The support platform 1 has a light hole through finishing threaded holes and the queued platform. The fine-tuning cross platform 8 is mounted in the center of the support platform 1, and there is also a light hole in the center, and a two-way light hole coaxial. The positioning sensor 6 is mounted on the fine tuning cross platform 8 via a bolt. A top camera 4, a top view camera bracket 5, a top view camera object 3, a top view camera light source 12, a plan view camera light source 12 is a set of XOY plane information for obtaining the positioning sensor 6; side view camera 13, side view camera 10 , The side view camera objective 3, the side camera light source holder 7, and the side camera light source 9 is a set of YOZ plane information for obtaining the positioning sensor 6...

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Abstract

The invention discloses a six-degree-of-freedom pose measuring device and method based on orthogonal binocular vision. The device comprises a supporting platform, two orthogonally-arranged cameras, low-magnification objective lenses matched with the cameras, a visual area light source, a camera support and a light source support, and further comprises pose sensors shot by the cameras and a fine adjustment cross platform located below the pose sensors, wherein the pose sensor is composed of three parts, including a glass substrate with high light transmittance, glass microspheres fixed on the substrate and a grid pattern processed on the glass substrate. The invention further discloses a using method of the measuring device, three-dimensional displacement change of the microsphere on the pose sensor is recorded through the camera, and pose change of the platform is calculated. The method is simple in structure and convenient to install, the change of the relative pose of the measured object can be directly given, and high-precision real-time measurement can be achieved.

Description

Technical field [0001] The present invention belongs to the field of test metering, and more particularly to a hexa freelance measurement device and method based on orthogonal binocular visual visual. Background technique [0002] The six free degree position measurement means that the displacement, angular displacement change information of some parts of the measurement body is detected, and the measurement information acquired by the low-degree-sensor sensor is converted to High freely measured body position position information, achieving six degrees of freedom space positioning of the object to be measured. In numerous measurement parameters, the six free degree position measurement technology with micro-nanometer precision is one of the most critical basic technologies, and is also the premise and foundation of other physical characteristics measurement characterization. [0003] From the measurement dimension, the ultra-high precision positioning system of six degrees of fr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C11/02G01C11/04G01B11/00
CPCG01B11/00G01C11/02G01C11/04
Inventor 王玉亮廉兆鑫周城嘉
Owner BEIHANG UNIV
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