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Semi-automatic wafer discharging device based on wax-free polishing process

A semi-automatic and process technology, applied in grinding/polishing equipment, manufacturing tools, grinding feed motion, etc., can solve the problems of silicon wafer scratches, increase in particle size, affecting the quality of wax-free polishing products, etc. Product quality, the effect of meeting product quality requirements

Pending Publication Date: 2020-02-21
ZHONGHUAN ADVANCED SEMICON MATERIALS CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Subsequent inspections of the wax-free polished wafers that were manually removed showed that the particle size at the reference surface of the wax-free polished wafers increased significantly, and there were scratches on the silicon wafers, which affected the product quality of the wax-free polished wafers.

Method used

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  • Semi-automatic wafer discharging device based on wax-free polishing process
  • Semi-automatic wafer discharging device based on wax-free polishing process
  • Semi-automatic wafer discharging device based on wax-free polishing process

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Embodiment Construction

[0024] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0025] Such as Figure 1 to Figure 5 As shown, a semi-automatic unloading device based on a wax-free polishing process includes a tooling shell and a lifting bracket 4, and a vertical elongated hole is opened on one side of the tooling shell, and the tooling shell outside the elongated hole is vertically An electric cylinder 3 and a linear guide rail 5 are installed in the direction, and the driving end of the lifting bracket 4 moves up and down along the linear guide rail 5 driven by the electric cylinder 3. The front end of the upper surface of the lifting bracket 4 is equipped with a vertically arranged first A cylinder 10, the upper end of the first cylinder 10 is installed on the jacking plate 13, the rear end of the lifting bracket 4 is rotationally connected with the rear end of the jacking plate 13, and the left and right sides of the upper surface...

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Abstract

The invention provides a semi-automatic wafer discharging device based on the wax-free polishing process. The semi-automatic wafer discharging device comprises a tool shell and a lifting bracket. Oneside of the tool shell is provided with a vertical strip-shaped hole. An electric cylinder and linear guide rails are vertically mounted in the position, on the outer side of the strip-shaped hole, ofthe tool shell. The driving end of the lifting bracket is connected with the electric cylinder and is clamped to the linear guide rails. The lifting bracket is connected with the front end of a jacking plate through a first cylinder. The lifting bracket is rotatably connected with the rear end of the jacking plate. Gear shaping plates are mounted on the jacking plate. Electric cylinder sliding tables are arranged on the gear shaping plates. The electric cylinder sliding tables are connected with a gear shaping device. The upper portion of the jacking plate is connected with a tray through a second cylinder. A center disk is mounted in the middle position of the upper surface of the tray. The edge of the center disk is provided with rollers. The semi-automatic wafer discharging device based on the wax-free polishing process has the beneficial effects of realizing semi-automatic wafer discharging, implementing discharging of wax-free polished wafers through a water gun in place of manual operation and preventing the disadvantages that the surface granularity of polished wafers is improved through to manual wafer discharging and the damage rate is increased.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a semi-automatic unloading device based on a wax-free polishing process. Background technique [0002] In the field of semiconductor silicon wafer manufacturing, silicon wafer particle size and surface scratches are one of the important quality issues, which are directly related to whether polished wafers can be used in subsequent production. In the existing process, the blanking of the wax-free polishing sheet is all done manually. After the operator pushes out the blanking cart loaded with the polishing sheet, after rinsing the surface of the silicon wafer, he uses his fingers to pinch the polishing sheet for reference. At the surface, remove the polishing sheet from the ceramic disc polishing pad, and then put it into the ramp of the existing unloading machine to complete the unloading. [0003] Subsequent inspections of the wax-free polished wafers that were manual...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B24B41/00B24B41/06
CPCB24B41/005B24B41/068
Inventor 李笑岩张淳李健乐陈震宇贾洁王彦君孙晨光
Owner ZHONGHUAN ADVANCED SEMICON MATERIALS CO LTD
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