Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Alignment system and alignment method for detection and calibration of telescope primary mirror

An alignment system and telescope technology, applied in the field of alignment systems for the detection and calibration of the primary mirror of the telescope, can solve the problems of small field of view, weak return light from the light source, and difficult alignment, so as to improve reliability, reduce complexity and Difficulty and easy operation

Active Publication Date: 2021-04-06
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] However, when the primary mirror is calibrated without destroying the primary mirror detection system, the Shaker-Hartmann (S-H) system needs to be aligned after the primary mirror detection is completed, because the Shaker-Hartmann (S-H ) system is sensitive to the influence of position, its field of view is small, and the alignment area of ​​the computational hologram (CGH) cannot be detected, and the return light of the light source is weak after propagation and reflection. Therefore, the Shack-Hartmann (S-H) system Alignment with the primary mirror is very difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Alignment system and alignment method for detection and calibration of telescope primary mirror
  • Alignment system and alignment method for detection and calibration of telescope primary mirror
  • Alignment system and alignment method for detection and calibration of telescope primary mirror

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0063] The core of the present invention is to provide an alignment system and alignment method for detecting and calibrating the primary mirror of a telescope, which can reduce the alignment between the Shack-Hartmann calibration device and the primary mirror without destroying the primary mirror detection system. difficulty.

[0064] Please refer to Figure 1-Figure 3 , figure 1 A schematic diagram of the alignment of the Shack-Ha...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an alignment system for detecting and calibrating a main mirror of a telescope, comprising a main mirror, a computational holographic element, an interferometer, a Shaker-Hartmann calibration device, a switching mirror, a first switching driving device, and a switching mirror When cutting out, the interferometer is aligned with the primary mirror; when the switching mirror is switched in, the Shack-Hartmann calibration device is aligned with the primary mirror; respectively connected to the computational holographic element and the interferometer to adjust the first pose of the two poses Alignment device to align the interferometer, computational holographic element, and primary mirror; spherical mirror to assist Shaker-Hartmann calibration device in aligning the primary mirror after the interferometer is aligned with the primary mirror, for adjusting the spherical A second pose adjustment device for the mirror pose to align the spherical mirror with the interferometer; a third pose adjustment device for adjusting the pose of the Shaker-Hartmann calibration device to align the Shaker-Hartmann Alignment of the Terman calibration device with the spherical mirror; reduces the difficulty of aligning the Shaker-Hartmann calibration device with the primary mirror.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to an alignment system for detection and calibration of a telescope primary mirror. In addition, the present invention also relates to an alignment method applied to the alignment system for detecting and calibrating the primary mirror of the telescope. Background technique [0002] In the field of optical inspection technology, interferometers and computational holographic elements (CGH) are usually used to inspect the surface shape of the primary mirror of the telescope to determine whether the surface shape of the primary mirror is qualified. [0003] With the increase of the telescope aperture, the support of the main mirror of the telescope has changed from a passive support to an active support. Therefore, in practical applications, in order to maintain a good surface shape of the mirror surface, it is necessary to use a force actuator to correct the surface shape. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24G02B7/182
CPCG01B11/2441G02B7/182G02B7/1822
Inventor 王文攀王建立王志臣李宏壮李洪文
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products