Optical deformation measurement method based on adaptive mesh and electronic equipment
An adaptive grid and optical deformation technology, applied in the field of optical measurement, can solve the problems of reducing the amount of information, increasing the random error, and increasing the calculation cost, and achieves the effects of simple use, improved calculation accuracy, and high robustness.
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[0047] figure 1 It is a schematic flow chart of Embodiment 1 of the present invention. In this embodiment, a simulated sinusoidal displacement field is used for calculation to illustrate the beneficial effect of the adaptive grid proposed by the present invention. Wherein the displacement field is a single sinusoidal displacement field: u=4Sin(2πx / 100), v=0, the maximum strain is 25.12%, and the maximum strain gradient is 1.85% (pixel-1 ), the size of the simulated image is 400 pixels×400 pixels, including 400×400×0.06 speckle particles, the particle diameter is 1.2 pixels, the signal-to-noise ratio SNR=+∞, and the range of the region of interest is 100 (pixels)≤x≤ 300 (pixels), 100 (pixels)≤y≤300 (pixels). The specific steps are as follows:
[0048] Step 1: Take the SSD related criterion (the sum of squares of the difference between gray values) as an example to construct the error function as follows:
[0049]
[0050] Among them, F(x, y) is the gray value at a certain...
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