Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Calibration compensation system and calibration compensation method for internal error of photon interference imaging system

A technology of interference imaging and error calibration, which is applied in the field of optical interference imaging, can solve problems such as device errors and affecting imaging system performance, achieve the effects of reducing volume, improving imaging quality, and omitting the manufacturing and debugging process

Active Publication Date: 2020-01-03
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The present invention provides a calibration compensation system and a calibration compensation method for the internal errors of the photon interference imaging system in order to solve the problems that there are various errors inside the devices of the existing interference imaging system, which further affect the performance of the imaging system.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Calibration compensation system and calibration compensation method for internal error of photon interference imaging system
  • Calibration compensation system and calibration compensation method for internal error of photon interference imaging system
  • Calibration compensation system and calibration compensation method for internal error of photon interference imaging system

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0034] Specific implementation mode 1. Combination figure 2Description of this embodiment, the internal error calibration and compensation system of the photon interference imaging system includes a calibration light source (thorlab 1550nm infrared laser), a phase adjustment device (general photonics electronic delay line), a PIC chip to be tested, and a light intensity detection device (short-wave infrared camera) , 1*2 fiber optic coupler, fiber optic jumper, etc. The PIC chip to be tested has two input ports and four output ports. The interior only includes a set of interferometers, which are composed of a pair of waveguides and a beam combiner. The waveguide mainly transmits light and adjusts the optical path. The beam combiner performs interference and completes the sampling of the fringes at quarter-period intervals.

[0035] One end of the optical fiber coupler is connected to the calibration light source, so that the calibration light source is divided into two outpu...

specific Embodiment approach 2

[0037] Specific embodiment two, combine image 3 Describe this implementation mode, this implementation is the calibration compensation method of the internal error calibration compensation system of the photon interference imaging system described in the specific implementation mode 1, establish a mathematical model of the PIC photonic integrated chip, calibrate the internal error of the system, and then re-image During the construction process, the calibration data is used to compensate for the error. By adopting a phase-locked dual light source calibration compensation method, and by controlling the light intensity and phase difference of the calibration light source, the high-precision error calibration compensation of the PIC chip to be tested is realized. This method adopts phase-locked dual light source calibration compensation, which is realized by the following steps:

[0038] 1. Establish a mathematical model of the input and output of the PIC chip to be tested. The...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a calibration compensation system and a calibration compensation method for an internal error of a photon interference imaging system, relates to the technical field of opticalinterference imaging, and solves problems that various errors exist inside a device of an existing interference imaging system so as to influence performance of the imaging system and the like. The calibration compensation system comprises a calibration light source, phase regulation devices, a to-be-detected PIC chip, a light intensity detection device and an optical fiber coupler; one end of the optical fiber coupler is connected with the calibration light source; the calibration light source is divided into two paths for output; each of two output ports of the other end of the optical fiber coupler is respectively connected with an input port of one phase regulation device; output ports of two phase regulation devices are respectively connected with two input ports of the to-be-detected PIC chip; and the light intensity detection device is arranged at the rear end of the to-be-detected PIC chip and is used for detecting output light intensity of four output ports of the PIC chip. According to the invention, an internal error of the PIC integrated chip is effectively corrected by establishing an error calibration compensation model, so that the system can achieve a good imagingeffect. The system operation is simplified.

Description

technical field [0001] The invention relates to the technical field of optical interference imaging, in particular to an internal error calibration compensation system and calibration compensation method of a photon interference imaging system. Background technique [0002] The core of photonic integrated interference imaging is the PIC photonic integrated chip. The PIC photonic integrated chip adopts integrated optical technology, which enables the device to maintain reliability and stability while greatly reducing the volume, and improves the performance of the device as a whole. Due to the complex internal structure of the device, it contains many structural units. Therefore, PIC photonic integrated chips are prone to errors during the manufacturing process, and once the chip is packaged and manufactured, the errors cannot be eliminated by hardware correction. Therefore, there is a need for a method that can learn the internal error of the photonic integrated chip, and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J3/28G01J3/02
CPCG01J3/0259G01J3/0297G01J3/2803G01J3/2823
Inventor 张怡王越刘欣悦孟浩然刘欣然樊元朋
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com