Fault positioning method, device and apparatus for startup process of server and storage medium
A fault location, server technology, applied in the fault hardware testing method, the use of power-on test to detect faulty hardware, and the detection of faulty computer hardware, etc., can solve problems such as long boot time, long serial port information export time, and slow fault location. To achieve the effect of shortening the export time, shortening the boot time, and improving the fault location speed
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0043] see figure 1 , figure 1 It is an implementation flow chart of a fault location method in the server startup process in the embodiment of the present invention, and the method may include the following steps:
[0044] S101: When it is detected that the server is powered on, sequentially detect whether there is a fault in the target to be tested in each detection stage, if yes, perform step S102, if not, do not process.
[0045] After the server is powered on, the input and output system will check each device inside the server. The entire power-on self-test process can be divided into stages in advance, and can be divided into multiple detection stages, for example, it can be divided into CPU detection stage, memory memory detection stage, and so on. When it is detected that the server is powered on, it is possible to sequentially detect whether there is a fault in the target to be tested in each detection stage. For example, it can be judged whether there is a fault ...
Embodiment 2
[0054] see figure 2 , figure 2 It is another implementation flowchart of the fault location method in the server startup process in the embodiment of the present invention, and the method may include the following steps:
[0055] S201: When it is detected that the server is powered on, according to the status information on the power-on self-test interface, sequentially detect whether there is a fault in the target to be tested in each detection stage, if yes, perform step S202, if not, do not process.
[0056] During the staged self-inspection, the identification information of the current inspection stage can be displayed synchronously through the power-on self-inspection interface, and according to the change of the inspection stage, the power-on self-inspection interface will be replaced with the identification information of the corresponding inspection stage. Therefore, it can be judged whether there is a fault of the target to be tested according to the status inform...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com