Fault Diagnosis Method of Analog Circuit Based on Polynomial Fitting and Condition Monitoring

Abstract

The invention discloses a fault diagnosis method for analog circuits based on polynomial fitting and state monitoring. The transfer function of the measuring point is obtained, the fuzzy group information of the analog circuit is analyzed, the representative fault element of each fuzzy group is determined, and each fault component is obtained based on the transfer function. Represent the characteristic matrix of the faulty component, construct an overdetermined equation group of polynomial fitting, calculate the coefficient vector corresponding to each representative faulty component, when the analog circuit fails, monitor the state of the measuring point, and obtain the test matrix and constant term matrix, Find the eigenvector that makes the test matrix and the equation determined by each representative fault component eigenvector have the least square distance, and the corresponding representative fault component is the fault diagnosis result. The fault diagnosis of analog circuits can be effectively realized by adopting the invention.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit fault diagnosis method based on polynomial fitting and state monitoring. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some relatively well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-...

AI Technical Summary

Problems solved by technology

Overlapping regions illustrate faults from different fault sources that could otherwise be distinguished, but due to tolerance effects, these faults have the same characteristics and are therefore inseparable

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