A kind of fabric material anisotropy characterization method and measuring device
A fabric material and anisotropy technology, applied in the field of textile testing, can solve the problems of difficulty in accurately reflecting the anisotropic characteristics of the internal structure of the fabric, and the inaccuracy and appropriateness of the characterization index system.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0061]The present invention will be further described below in conjunction with specific embodiments. It should be understood that these embodiments are only used to illustrate the present invention and not to limit the scope of the present invention. In addition, it should be understood that after reading the teachings of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims of this application.
[0062]A method for characterizing the anisotropy of fabric materials. After applying droplets with a volume of 0.01-500.0mL on the surface of a horizontally placed fabric, simultaneously collect the upper surface of the fabric at a set time interval (0.1-300 seconds). The wetting contour image of the lower surface, after the polar coordinate system is established in the wetting contour image, the index is measured and calculated, and the index is ...
PUM
Property | Measurement | Unit |
---|---|---|
volume | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com