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Target sample generation method based on infrared simulation

An infrared target imitation technology, which is applied in the field of target characteristic modeling and target recognition, can solve the problems of low reliability of heterogeneous matching and recognition of infrared targets, difficulty in adapting to the external environment, etc., and achieve information processing, high degree of automation, and improved accuracy degree of effect

Active Publication Date: 2019-08-23
BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH
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Problems solved by technology

[0003] The present invention provides a method for generating target samples based on infrared simulation, which can solve the technical problems of low reliability in identifying infrared targets by heterogeneous matching and difficulty in adapting to various external environments in the prior art

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  • Target sample generation method based on infrared simulation

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[0017] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as any limitation of the invention, its application or uses. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0018] It should be noted that the terminology used here is only for describing specific implementations, and is not intended t...

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Abstract

The invention provides a target sample generation method based on infrared simulation, and the method comprises the steps: 1, carrying out the modeling of a target region scene, completing the regiondivision and material assignment of the target region scene, and generating a material image of the target region scene; 2, constructing a three-dimensional scene of the target area scene according tothe material image, the model of the target area scene and the elevation data of the target area scene; 3, setting external environment conditions of the target area scene, and performing temperaturefield calculation, infrared radiation calculation and atmospheric transmissivity calculation of the target area scene to generate an infrared simulation scene under a zero visual range of the targetarea scene; and 4, generating an infrared simulation target sample according to the viewpoint parameter and the imager parameter on the basis of the infrared simulation scene of the target area scene.By applying the technical scheme provided by the invention, the technical problems of low reliability of heterologous matching identification of the infrared target and difficulty in adapting to various external environments in the prior art are solved.

Description

technical field [0001] The invention relates to the technical field of target characteristic modeling and target recognition, in particular to a method for generating target samples based on infrared simulation. Background technique [0002] At present, the infrared characteristics of targets are complex, and their changes are obvious with time, weather, location and other conditions. For some special applications such as military fields, it is very difficult to realize infrared target recognition. In order to improve the ability to identify infrared targets, it is generally necessary to train and learn a large number of infrared targets. However, in most cases, the means to obtain infrared target samples are limited, which requires considerable manpower, material and financial resources. In existing studies, some researchers have proposed a method to generate target visible light sample data, and realize target recognition by performing heterogeneous image processing on vis...

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Application Information

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IPC IPC(8): G06F17/50G06T17/00
CPCG06T17/00G06F30/20G06F16/29
Inventor 张云梁文宝张锐孙银江李振
Owner BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH
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