An automated single particle radiation test control system and method

Abstract

The invention relates to an automatic single particle irradiation test control system and method. The system comprises an experimental instrument program control module, a fluence rate monitoring module, an error number counting module and a timing detection module. According to the invention, the automatic opening and closing of the chip irradiation test are realized by presetting an irradiationcondition threshold value, the automation degree of the integrated circuit single particle irradiation test is effectively improved, and the waste of a single particle irradiation tester and the workload of an experimenter are reduced; and meanwhile, the generated data file contains all test data (particle fluence rate, total particle fluence, test current, single particle error number and test waveform), so that the single particle test accuracy is improved, and is beneficial to the subsequent personnel to analyze the test result.

Description

technical field [0001] The invention relates to an automatic single-particle radiation test control system, which belongs to the technical field of semiconductor integrated circuit anti-space single-event effect verification. Background technique [0002] Domestic single-particle ground simulation verification of aerospace components requires the use of heavy ion accelerators. An irradiation test platform was built at the beam port provided by the accelerator to verify the ability of the chip to resist single event effects. Due to the complexity of accelerator debugging, many parameters are required for debugging, but the accelerator will provide the output of irradiation parameters under current conditions, such as particle fluence rate; in the previous single particle irradiation test platform, experimenters need to observe the irradiation of the test with naked eyes Conditions start (end) the test process, so there will inevitably be large errors and delays, and the test...

AI Technical Summary

Problems solved by technology

Due to the complexity of the accelerator debugging, many parameters are required for debugging, but the accelerator will provide the output of the irradiation parameters under the current conditions, such as the particle fluence rate; in the previous single particle irradiation test platform, the experimenter needs to observe the irradiation of the test with naked eyes Conditions start (end) the test process, so there will inevitably be large errors and delays, and the test variables of the chip under test (particle fluence rate, total particle fluence, chip Current, single event error number, test stimulus, test waveform) will affect the follow-up designer's analysis of the circuit being irradiated

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