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CMOS self-calibrating light intensity monitoring integrated circuit

An integrated circuit and light intensity monitoring technology, which is applied in photometry, optical radiation measurement, and comparison with reference electrical parameters. , Wide detection range and small error

Pending Publication Date: 2019-07-02
ZHEJIANG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the weak photoelectric sensing signal, the attenuation and interference of signals between board levels will reduce the accuracy of measurement

Method used

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  • CMOS self-calibrating light intensity monitoring integrated circuit
  • CMOS self-calibrating light intensity monitoring integrated circuit
  • CMOS self-calibrating light intensity monitoring integrated circuit

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Embodiment Construction

[0025] Further illustrate the present invention below in conjunction with accompanying drawing.

[0026] The CMOS self-calibration light intensity measurement and monitoring integrated circuit of the present invention consists of a light intensity measurement circuit 1, a current-voltage linear conversion circuit 2, a self-calibration / monitoring control switch array 3, an output voltage sampling and holding circuit 4, and a comparison amplifier circuit 5. It consists of 5 circuit modules.

[0027] The light intensity measurement circuit 1 converts the light signal into an electrical signal by using the diode photoelectric effect, the photodiodes D1 and D2 are used to convert the light signal into an electrical signal, and the light intensity has a strong dependence on the output current. The photodiodes D1 and D2 adopt a parallel structure, and the output current of the output terminal 1b of the light intensity measurement circuit is the sum of the currents of D1 and D2, which...

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Abstract

The invention provides a CMOS self-calibrating light intensity monitoring integrated circuit. In a light intensity measuring circuit, the output end is connected with the input end of a current voltage linear conversion circuit. The input end of the current voltage linear conversion circuit is connected with the output end of the light intensity measuring circuit and the first input end 3a of a self-calibrating / monitoring control switch array. The first input end of the self-calibrating / monitoring control switch array is connected with the output end of the current voltage linear conversion circuit. The second input end SEL is a self-calibrating control input end. The first output end and the second output end are connected with the first input end and the second input end of an output voltage sampling and holding circuit respectively. The first input end and the second input end of the output voltage sampling and holding circuit are connected with the first output end and the second output end of the self-calibrating / monitoring control switch array. The first input end and the second input end of a comparison amplifying circuit (5) are connected with the first output end and the second output end of the output voltage sampling and holding circuit respectively. The output end OUT2 is the output end of the circuit provided by the invention.

Description

technical field [0001] The invention relates to a CMOS self-calibration light intensity monitoring integrated circuit. Background technique [0002] Light intensity measurement and monitoring has become a popular trend in the application of LED intelligent lighting control and intelligent animal and plant breeding technology. Through light measurement and monitoring and further feedback and control, the lighting system can be intelligently adjusted, the growth cycle of animals and plants can be controlled, and the growth cycle of animals and plants can be improved. output, save time and cost, etc. [0003] Buried dual PN junction photodiodes consist of two vertically stacked diodes of different depths. The output current has a linear relationship with the incident light power under illumination, and it can be used as a photodetector for the measurement of illumination intensity. [0004] The light intensity measurement and monitoring integrated circuit based on microelectr...

Claims

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Application Information

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IPC IPC(8): G01J1/02G01J1/16H04N5/225
CPCG01J1/0295G01J1/16H04N23/54
Inventor 施朝霞吴丽丽李如春
Owner ZHEJIANG UNIV OF TECH
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