A software multi-error localization method and processing device based on particle swarm optimization

A technology of particle swarm optimization and error location, which is applied in software testing/debugging, etc., can solve problems such as low efficiency and poor effect of multiple error location, and achieve the effect of improving efficiency and poor solution effect

Active Publication Date: 2022-05-17
HENAN UNIVERSITY OF TECHNOLOGY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a software multi-error location method and processing device based on particle swarm optimization to solve the current problem of poor multi-error location effect and low efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A software multi-error localization method and processing device based on particle swarm optimization
  • A software multi-error localization method and processing device based on particle swarm optimization
  • A software multi-error localization method and processing device based on particle swarm optimization

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0039] The invention provides a software multi-error location processing device based on particle swarm optimization, which includes a memory, a processor, and a computer program stored in the memory and operable on the processor, wherein the processor executes a software based on particle swarm optimization The multi-error localization method, through in-depth analysis of the data dependence and control dependence of the program, plans to use the forward calculation method to calculate the backward dynamic slice of the program, and analyze the impact set of the defined variables to find out the actual reference variables of the current variables when they are defined. An improved dynamic slicing is proposed to narrow the scope of error location; then the potential error distribution is represented in binary form, the population of error distribution is initia...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of software testing, in particular to a particle swarm optimization-based method for locating multiple software errors and a processing device. According to the dynamic slicing to narrow the scope of error location, combined with the theory and method of particle swarm optimization algorithm, through the fitness function constructed by expanding the suspicion calculation formula based on the program spectrum information and program execution results, the optimal solution is obtained and mapped to the real The error location can effectively identify multiple errors in the software, and can significantly improve the efficiency of software error location. Therefore, it solves the current problem of poor effect and low efficiency of multiple error location.

Description

technical field [0001] The invention relates to the technical field of software testing, in particular to a particle swarm optimization-based method for locating multiple software errors and a processing device. Background technique [0002] In the process of software development and maintenance in the industry, almost all software may contain multiple errors, and locating multiple errors in software is a key problem that needs to be solved urgently in the field of software error location. Some studies have proposed a multi-error localization method based on cluster analysis. They first use failure proximity to identify whether two failed execution trajectories are similar, that is, two failed execution trajectories pointing to roughly the same error location are considered to be similar, but different from each other. The trajectories with similar execution behaviors in previous studies are similar. On this basis, the cluster analysis method is used to cluster the failed ex...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 曹鹤玲张庆辉杨铁军费选靳小波鲁斌
Owner HENAN UNIVERSITY OF TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap