Method of Fault Location Based on Combination Test

A technology of error location and combined testing, applied in software testing/debugging, etc., can solve problems such as unguaranteed test cases

Active Publication Date: 2017-12-05
NANJING UNIV OF POSTS & TELECOMM
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  • Claims
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Problems solved by technology

However, this method cannot guarantee that the generated test cases are optimal
Lei and Tai proposed a pairwise combination coverage test data generation method based on the gradual expansion of parameter order, which has better characteristics in some aspects, but at the same time, this method also has great shortcomings

Method used

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  • Method of Fault Location Based on Combination Test
  • Method of Fault Location Based on Combination Test
  • Method of Fault Location Based on Combination Test

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Embodiment Construction

[0084] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0085] On the basis of fully considering to ensure the optimal generation result, a new test data generation algorithm about pairwise combination coverage is proposed. The method of the embodiment is mainly to analyze the failure mode set at the output terminal on the basis of the existing theory, and combine the apriori algorithm to find the set of suspicious failure modes to locate the error, and finally improve the certainty and accuracy of the error location. The Apriori algorithm is a frequent itemset algorithm for mining association rules, such as figure 2 shown.

[0086] The error location method based on the combination test of the embodiment starts from the result of the output end, analyzes the failure mode of the output end, combines the apriori algorithm to locate the error, and improves the accuracy rate and accuracy rate of er...

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Abstract

The invention provides an error location method based on combined testing. The method starts with the result of the output end, analyzes the failure mode of the output end, combines the apriori algorithm to locate the error, and improves the accuracy rate and accuracy rate of error location. As a method for locating faults in software testing, the invention ensures the accuracy of error locating results. Compared with the existing technology, it has the following characteristics and innovations: In the error location method based on combined testing, the output failure mode is scanned to find out the most frequently occurring itemsets, and suspicious failure modes are generated after repeated scanning Set, improve the efficiency of software error location.

Description

technical field [0001] The invention relates to a method for locating errors based on combined testing, which belongs to the field of locating errors in software testing. Background technique [0002] A software system may be affected by the interaction of its parameters. These interactions need to be tested to ensure the quality of the software. But for a system under test with n parameters, since there are many combinations of parameter values, it is impossible for us to cover all possible combinations of n-tuple parameter values. Combined testing is a compromise between test cost and combined coverage. For example, the 2-dimensional combination test requires coverage of all 2-grams, which is not the case in n-grams. [0003] After error detection, error localization plays an important role in software quality assurance, and it is also needed to assist software debugging. In the interactive fault localization phase, based on the information obtained from the execution ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 张卫丰陆子南王云王子元
Owner NANJING UNIV OF POSTS & TELECOMM
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