A Statistical Error Localization Method Based on Black-box Test Case Reduction

A test case and error statistics technology, which is applied to error location in program debugging, software testing and program debugging, and can solve problems such as taking a long time to collect test information.

Inactive Publication Date: 2018-03-02
CHINA UNIV OF MINING & TECH
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Problems solved by technology

[0005] The purpose of the present invention is to provide a statistical error location method based on black-box test case reduction, which solves the problem that the current statistical error location method takes a long time to collect test information, and then greatly improves the efficiency and efficiency of the statistical error location method. Ease of use improves the efficiency of program debugging, thereby better ensuring the quality of software

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  • A Statistical Error Localization Method Based on Black-box Test Case Reduction
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  • A Statistical Error Localization Method Based on Black-box Test Case Reduction

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[0065] In order to better understand the technical content of the present invention, specific implementations and accompanying drawings are described as follows.

[0066] figure 1 It is a flowchart of a statistical error localization method based on black-box test case reduction implemented in the present invention.

[0067] A method for locating statistical errors based on reduction of black-box test cases is characterized by comprising the following steps.

[0068] The construction of S1 test case distance matrix, given a test case set, maps it to a test case string for each test case, and uses the distance measurement method to measure the distance between the test case strings, thereby generating a test case Distance matrix, each position in the matrix records the distance information between two test cases.

[0069] S2 automatically reduces the test case set, sets the test requirements, and uses the greedy algorithm to gradually identify the test cases that are most lik...

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Abstract

The present invention relates to a statistical error localization method based on reduction of black-box test cases. For a given set of test cases, a distance measurement method is used to measure the degree of difference between test cases, thereby constructing a test case distance matrix; Test requirements, using a greedy algorithm to reduce test cases to generate a test case set that meets the test requirements, and collect program coverage information and program execution results of the reduced test case set, and then build a test case coverage matrix; then carry out statistical error location To measure the suspiciousness of statement errors in the program, and finally generate a software error location report. The purpose of the present invention is to solve the problem that the current statistical error location method takes a long time to collect test information, thereby greatly improving the efficiency and ease of use of the statistical error location method, and improving the efficiency of program debugging, thereby better ensuring The quality of the software.

Description

technical field [0001] The invention belongs to the field of software testing and program debugging, especially the field of error positioning in program debugging, which is used for locating wrong program entities in software and is a method for ensuring software quality and reliability. Background technique [0002] With the continuous development of computer hardware technology and the diversification of application requirements, the scale and complexity of computer software systems continue to increase. At the same time, human society has higher and higher requirements for the development efficiency and product quality of software systems. Software testing and program debugging are the main means to detect and correct software errors and ensure software quality in the industry. to improve the quality and reliability of software products. [0003] Software error localization is an important step in the process of program debugging. According to the survey, the cost of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 姜淑娟王兴亚高鹏飞于巧张艳梅鞠小林王荣存
Owner CHINA UNIV OF MINING & TECH
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