Method for judging inclusion group flaws in flat metal plate by using double-crystal straight probe
A flat metal, straight probe technology, used in the analysis of solids using sonic/ultrasonic/infrasonic waves, can solve problems such as clear instructions, and achieve the effects of improving accuracy, lowering personnel training costs, and reducing difficulty
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[0019] Below in conjunction with embodiment the present invention is described in further detail:
[0020] A method for judging inclusion group defects in flat metal plates with dual-crystal straight probes, suitable for the detection of internal inclusion groups on flat metal plates with a thickness of more than 6mm by using a type A pulse reflection ultrasonic flaw detector, and also applicable to conventional The 5Pφ20F10 dual-crystal straight probe detects the internal inclusion group on the flat metal plate with a thickness of more than 6mm, including the following steps:
[0021] (1) Choose to use 5Pφ20F10 dual crystal straight probe:
[0022] (2) Choose to use the flaw detector within the verification period to adjust the instrument;
[0023] (3) After finding the defect, adjust the detection sensitivity to see the peak profile of the defect wave;
[0024] (4) When judging whether the waveform satisfies the following conditions, if so, it can be judged that the defect...
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