X-ray Diffraction Data Analysis System

Abstract

The invention belongs to the field of crystal structure analysis, and specifically relates to an X-ray diffraction data analysis system, including a format conversion module, a data processing module, a data analysis module, a batch processing module, a calculation service module, a resource statistics service module, and a user authentication module. The X-ray diffraction data analysis system provided by the present invention can perform data processing in batches, and combines artificial intelligence technology to enhance data collection capabilities. It is a more efficient indexing method, rich visual analysis, and can effectively reduce labor costs.

Description

technical field [0001] The invention belongs to the analysis field of crystal structures, and in particular relates to an X-ray diffraction data analysis system, which improves the processing efficiency of X-ray diffraction data through batch processing, automatic execution and visual analysis. Background technique [0002] XRPD is commonly known as X-ray powder diffraction (XRPD). Usually used in the analysis of crystal structure. X-ray is a kind of electromagnetic wave, which produces a periodically changing electromagnetic field in the crystal when it is incident on the crystal. Cause the electrons and nuclei in the atom to vibrate, because the mass of the nucleus is very large and the vibration is negligible. The vibrating electrons are the wave source of the secondary X-rays, whose wavelength and phase are the same as the incident light. Based on the periodicity of the crystal structure, the scattered waves of the electrons in the crystal interfere with each other an...

AI Technical Summary

Problems solved by technology

Therefore, the batch processing ability of the tool is insufficient, and the operation cost of single sample processing is high; the statistical analysis ability of a large amount of data is insufficient; the concurrent computing ability is insufficient

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