Wavelength offset correction method and device and computer device

Abstract

The invention discloses a wavelength offset correction method, which comprises the following steps of: acquiring a reference spectrum and a spectrum to be corrected; calculating an intensity density function of each pixel in the spectrum to be corrected to obtain a polynomial coefficient matrix, wherein each group of polynomial coefficients in the polynomial coefficient matrix are coefficients ofthe intensity density function of one pixel in the spectrum to be corrected respectively; determining a pixel offset range; calculating a spectrum to be audited corresponding to each pixel offset according to the pixel offset in the pixel offset range and the polynomial coefficient matrix; determining the spectrum to be audited which is closest to the reference spectrum to obtain the optimal pixeloffset; correcting the spectrum to be corrected according to the optimal pixel offset and the polynomial coefficient matrix to obtain the spectrum after wavelength offset correction. The wavelength offset correction method can correct the non-integer multiple pixel offset of the spectral data without depending on a peak finding method. The method also discloses a wavelength offset correction device and a computer device.

Description

technical field [0001] The invention belongs to the field of spectrum analysis, and in particular relates to a wavelength offset correction method and device and computer equipment. Background technique [0002] The micro fiber optic spectrometer uses a linear array detector to convert the optical signal into an electrical signal, and the echelle grating uses an area array detector to convert the optical signal into an electrical signal. During the use of these full-spectrum direct-reading spectrometers, the temperature, humidity, vacuum degree, mechanical vibration, and mechanical stress deformation of the optical chamber will affect the optical path structure, resulting in small changes in the relative position of the spectrum and the linear array detector, which is expressed as a specific wavelength. The pixel on the linear array detector is shifted, that is, the spectral position changes; for the sequential scanning spectrometer, since the stepping motor needs to be used...

AI Technical Summary

Problems solved by technology

Among them, the temperature control method of the optical chamber: when the external temperature changes, the temperature distribution of the optical chamber will still change, and the spectral position will still drift slightly, which cannot be eradicated, and cannot be solved due to mechanical vibration and mechanical stress deformation. The wavelength shift problem caused by the mechanical backhaul difference

Light source calibration method: It needs to be performed regularly with the help of external or built-in calibration light sources (neon lamp, mercury lamp, xenon lamp or argon lamp). Generally, it also needs to cooperate with the peak-finding algorithm. Using an external calibration light source cannot achieve real-time calibration of spectral wavelengths. Using a built-in calibration light source requires Make changes to the spectrometer hardware itself

And when the spectral position drifts, it is always accompanied by a small amount of scaling or distortion, resulting in a certain deviation in the actual position of the calculated spectrum.

[0004] The above innovations in the field of spectral wavelength offset correction algorithms all need to be used in conjunction with the peak-finding method, and can only shift the entire pixel position of the spectral data, and cannot handle the case where the offset is not an integer multiple

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