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Terahertz spectroscopy test apparatus and system

A technology of spectral testing and terahertz detection, applied in the field of spectral testing, can solve the problems of low accuracy of test results, and achieve the effect of high accuracy of test results

Inactive Publication Date: 2019-04-16
SHENZHEN CCT THZ TECH CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Based on this, it is necessary to provide a terahertz spectrum testing device and system for the low accuracy of the test results of the traditional terahertz spectrum testing device

Method used

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  • Terahertz spectroscopy test apparatus and system
  • Terahertz spectroscopy test apparatus and system
  • Terahertz spectroscopy test apparatus and system

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Embodiment Construction

[0020] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Preferred embodiments of the application are shown in the accompanying drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the application more thorough and comprehensive.

[0021] see figure 1 , a terahertz spectrum testing device, comprising: a femtosecond fiber laser 500, a terahertz emission device 100, a sample suspension device 200 and a terahertz detection device 300, the sample suspension device 200 is arranged on the terahertz emission device 100 and the terahertz detection device Between 300, the terahertz detection device 300 is used to connect to an external signal processing circuit, the femtosec...

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Abstract

The invention relates to a terahertz spectroscopy test apparatus and system. A femtosecond fiber laser is used for generating pump light and probe light, the pump light excites a terahertz emission device and radiates terahertz waves, the generated terahertz waves are emitted to a sample suspension device to radiate a to-be-tested sample arranged in a suspension manner, and the probe light is directly sent to a terahertz detecting device. The terahertz detecting device receives the terahertz waves emitted after passing through the sample suspension device, and the terahertz waves and the probelight are together sent to a signal processing circuit to obtain corresponding terahertz time domain spectrums. Through the above terahertz spectroscopy test apparatus and system, the to-be-tested sample does not need to be fixed with instruments such as clamps, and the condition that during terahertz spectroscopy testing, the terahertz waves are radiated to the instrument for fixing the to-be-tested sample, and the testing results are affected is avoided; and compared with a conventional terahertz spectroscopy test device, the terahertz spectroscopy test apparatus has the advantage of beinghigh in test result accuracy.

Description

technical field [0001] The present application relates to the technical field of spectrum testing, in particular to a terahertz spectrum testing equipment and system. Background technique [0002] Terahertz time-domain spectroscopy technology is a method that uses femtosecond pulses to generate and detect time-resolved terahertz electric fields, obtains frequency-domain spectral information of the measured object through Fourier transform, and then can analyze and identify the material structure and physical properties through characteristic frequencies. technology. Due to the low energy, high safety performance and strong penetrability of terahertz waves, terahertz time domain spectroscopy technology is widely used in chemical materials, biomedicine, food testing, oil exploration and safety inspection and other fields. [0003] When using terahertz waves to test samples, traditional terahertz spectroscopy testing devices first fix the samples to be tested by clamps or othe...

Claims

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Application Information

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IPC IPC(8): G01N21/3586
CPCG01N21/3586G01N21/39G01N2021/396
Inventor 郭翠潘奕薛占强
Owner SHENZHEN CCT THZ TECH CO LTD
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