Decomposition method for electromagnetic scattering mechanisms

A scattering mechanism and electromagnetic scattering technology, applied in the direction of radio wave measurement systems, instruments, etc., can solve the problem of not being able to directly distinguish the type of scattering, achieve the effect of anti-camouflage target recognition, improve recognition accuracy, and improve the level of awareness

Active Publication Date: 2019-03-15
NORTHWESTERN POLYTECHNICAL UNIV
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although high-frequency scattering algorithms can distinguish between several common types of scattering mechanisms, such as physical optics (PO) for specular scattering contributions, diffraction theory (GTD or PTD) or equivalent electromagnetic currents (MEC) for edge scattering contributions , multiple scattering contributions can be obtained by bouncing ray method (SBR). However, in many cases, the scattered field obtained is in the form of a total field, in which various scattering contributions are superimposed, and each scattering type cannot be directly distinguished. For example, the experimental test obtained Scattering field, scattering field obtained by low frequency algorithm

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Decomposition method for electromagnetic scattering mechanisms
  • Decomposition method for electromagnetic scattering mechanisms
  • Decomposition method for electromagnetic scattering mechanisms

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described:

[0033] The purpose of the present invention is to realize the decomposition of various scattering mechanisms in the composite scattering characteristics, construct a systematic theoretical method of scattering mechanism decomposition, and form a new method and new technology for the recognition of electromagnetic scattering mechanisms; and then realize the scattering by establishing an application model. Mechanism decomposition, extraction, reorganization and scattering feature reconstruction, systematically verify the scattering mechanism decomposition method, the overall research plan structure diagram of an electromagnetic scattering mechanism decomposition technology of the present invention is as follows figure 1 shown.

[0034] Step 1: Perform scattering calculations for complex targets, especially targets with complex structures or complex groups composed ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a decomposition method for electromagnetic scattering mechanisms, and relates to the field of electromagnetic scattering. The method comprises the steps that a target is subjected to scattering calculation to obtain a target total scattering field, the obtained total scattering field is subjected to time-frequency analysis, the distribution of different scattering mechanisms in the target scattering field is observed, a multi-resolution technology is adopted for decomposing and recognizing the scattering mechanisms, and then the scattering mechanisms and scattering characteristics are reorganized and reconstructed. By means of the decomposition technology for the scattering mechanisms, a special electromagnetic environment or a scattering source is subjected to scattering mechanism decomposition and recognition, a formation mechanism of the electromagnetic environment can be judged, different components of the scattering source are defined, a basis is providedfor the reconstruction or modification of the electromagnetic environment or the scattering source, a trailing smear interference and false scattering center formed by a complex target coupling effectcan be recognized and removed by means of the method, and the method is used for target recognition based on radar images and can significantly improve the recognition accuracy.

Description

technical field [0001] The invention relates to an electromagnetic scattering mechanism decomposition method, belonging to the field of electromagnetic scattering. Background technique [0002] When electromagnetic waves irradiate complex targets, the smooth surface of the target will produce specular scattering contributions, discontinuous structures such as spires and edges will produce diffraction contributions, and concave structures will have electromagnetic coupling effects or multiple scattering contributions. In addition, there are also There are scattering contributions from different mechanisms such as surface waves and creeping waves. Although high-frequency scattering algorithms can distinguish between several common types of scattering mechanisms, such as physical optics (PO) for specular scattering contributions, diffraction theory (GTD or PTD) or equivalent electromagnetic currents (MEC) for edge scattering contributions , multiple scattering contributions ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/41
CPCG01S7/41
Inventor 李建周刘祥威刘露范超群
Owner NORTHWESTERN POLYTECHNICAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products