Method and device for detecting performance of reflecting surface of compact field

Abstract

The invention relates to a method and device for detecting the performance of a reflecting surface of a compact field. One embodiment of the method comprises the steps that sampling is performed on across section of the dead zone of the compact field, and two-dimensional electric field data is obtained; two-dimensional Fourier inverted transformation is performed on the two-dimensional electric field data, and plane wave spectral distribution data of measuring signals is obtained; a space conversion function of electromagnetic waves in the propagation process from a sampling point to the reflecting surface is determined, and the space conversion function is used for processing the plane wave spectral distribution data, and plane wave spectral distribution data of the reflecting surface isobtained; two-dimensional Fourier transformation is performed on the plane wave spectral distribution data of the reflecting surface, and two-dimensional electric field distribution data of the reflecting surface is obtained; on the basis of the two-dimensional electric field distribution data of the reflecting surface, the performance of the reflecting surface is detected. According to the embodiment, the two-dimensional electric field distribution data of the reflecting surface can be obtained, and therefore the performance of the reflecting surface of the compact field can be effectively detected.

Description

technical field [0001] The invention relates to the field of electromagnetic scattering measurement, in particular to a method and a device for detecting the performance of a compact field reflection surface. Background technique [0002] The reflective surface is an important part of the compact field darkroom, and its function is to convert the spherical electromagnetic wave radiated by the feed source into a plane wave at close range, forming a quiet zone (that is, a working zone) that meets the requirements of far-field testing. Performance indicators such as reflective surface shape, cross-polarization purity, edge diffraction, and sawtooth edge design will affect the size and quality of the quiet zone in the darkroom. In particular, the reflective surface in the actual darkroom will further reduce the performance of the quiet zone due to factors such as processing accuracy and deformation. [0003] Performance testing of reflective surfaces is a technical difficulty i...

AI Technical Summary

Problems solved by technology

Since the reflective surface is fixedly installed in a dark room, it is difficult to deploy equipment for testing its deformation, damage and other indicators, and changes in physical dimensions such as the deformation of the reflective surface cannot explain its impact on electromagnetic reflection

Nowadays, the commonly used detection method is to test the electric field distribution in the quiet zone of the darkroom, but the field distribution in the quiet zone not only includes the influence of the reflective surface, but also includes the interference of various stray waves such as darkroom interference sources and multipath effects. performance diagnostic results can be noisy

[0004] Therefore, in view of the situation that it is difficult to detect the electromagnetic performance of the reflective surface in the compact field darkroom, a method for detecting the performance of the reflective surface in the compact field is urgently needed to provide technical support for the performance inspection and repair of the reflective surface.

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