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A method for making an impact response spectrum test profile

A technology of shock response spectrum and test profile, which is applied in the field of shock response spectrum test profile formulation, and can solve problems such as conservative and under-testing.

Inactive Publication Date: 2019-03-05
ZHUZHOU CSR TIMES ELECTRIC CO LTD
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Problems solved by technology

Using the envelope method to formulate the shock response spectrum test profile is actually to take the maximum value of each curve, so it is unavoidably too conservative to do the test with this test profile; and the method of taking the average value is simple, but it will discard many larger ones that appear in the field. value, so it is prone to the risk of under-testing

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  • A method for making an impact response spectrum test profile
  • A method for making an impact response spectrum test profile
  • A method for making an impact response spectrum test profile

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Embodiment Construction

[0056] The present invention will be further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.

[0057] Such as figure 1 As shown, the method for formulating the shock response spectrum test profile in this embodiment includes the following steps: S1. Through the shock test, the shock response spectrum of the same data channel obeys the normal distribution, and the energy spectral density obeys the chi-square distribution and belongs to the same population. Shock data, using the shock response spectrum of the shock data to construct feature samples; S2. Divide the frequency bands of the feature samples along the frequency axis into different frequency bands, and determine the flat spectrum of each frequency band; S3. Calculate the flat An upper tolerance limit of the spectrum from which a canonical spectrum is generated.

[0058] In this embodiment, the sp...

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Abstract

A method for making an impact response spectrum test profile includes the following steps of obtaining the impact data of which the impact response spectrum obeys the normal distribution, the energy spectrum density obeys the chi-square distribution and which belongs to the same population, through an impact test, and constructing the characteristic sample with the impact response spectrum of saidimpact data; 2 dividing the frequency bands of the characteristic sample along the frequency axis distribution into different frequency bands, and determining the flat spectrum of each frequency band; S3 calculating an upper tolerance limit of the flat spectrum, and generating a gauge spectrum according to the upper tolerance limit. The method of the invention has the advantages that the actual environment of the impact can be well reflected, and the result is more accurate and the like.

Description

technical field [0001] The invention relates to an impact response test, in particular to a method for formulating an impact response spectrum test profile. Background technique [0002] The purpose of the impact test is to determine the adaptability of the product to withstand non-repetitive mechanical shocks during use and transportation, the integrity of its structure and the confidence that the product is resistant to impact loads. At present, the shock test of rolling stock equipment mostly uses the shock effect generated by simple pulses to simulate the actual shock environment, such as the half-sine waveform pulse in GB / T 21563-2008 (idt IEC61373:1999). This simulation method is easy to use and easy to operate. It is simple and repeatable, but this kind of impact will have a large low-frequency energy, and the device under test may be damaged due to low-frequency over-testing during the test. In addition, since the shock suffered by the product in the actual environm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/18G06F17/50
CPCG06F17/18G06F30/20
Inventor 刘国涛吴永生王鹏余锋
Owner ZHUZHOU CSR TIMES ELECTRIC CO LTD
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