Back focal plane imaging device combined with low-temperature ultra-high vacuum scanning tunneling microscope

Abstract

The invention provides a back focal plane imaging device combined with a low-temperature ultra-high vacuum scanning tunneling microscope. The device comprises a to-be-measured sample, an optical imaging assembly, an integrated support, an extra-cavity lens group of the scanning tunneling microscope and an optical detector. A metal electrically excites the surface of the to-be-measured sample to generate a surface plasmon, and the optical imaging assembly collects a large-angle optical signal of the radiation leakage formed in the propagation process of the surface plasmon and converts the large-angle optical signal into parallel optical signals for output. The extra-cavity lens group of the scanning tunneling microscope receives the parallel optical signals for convergence and/or imaging and then outputs the signal, and the optical detector performs spectral measurement and/or back focal plane imaging of the received optical signal. The device facilitates imaging of the feature of theback focal plane of the sample illumination and the measurement of associated spectrums in a low-temperature ultra-high vacuum environment.

Description

technical field [0001] The present disclosure relates to the technical field of optical detection, in particular to a back focal plane imaging device combined with a low-temperature ultra-high vacuum scanning tunneling microscope. Background technique [0002] According to the Abbe imaging principle, the spatial frequency information on the Fourier plane (back focal plane) of the lens can represent the radiation direction of the light source, and the spatial angular distribution characteristics of the light source radiation can be obtained by imaging the back focal plane of the lens. In a scanning tunneling microscope (STM), for nanostructures such as molecules and quantum dots placed on the metal interface, the luminescence generally propagates outwards by means of surface plasmons, so the radiation of the relevant surface plasmons is measured The distribution characteristics can reflect the characteristics of nanostructures such as molecules and quantum dots. During the p...

AI Technical Summary

Problems solved by technology

The leakage radiation signal of the surface plasmon polaritons on the upper surface of the sample will touch the lower surface of the sample substrate during the downward propagation process. Since the numerical aperture value corresponding to the radiation angle is greater than 1, it will be at the lower surface of the sample-vacuum interface. When total reflection occurs, the corresponding optical signal cannot be collected on the back of the sample

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