Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Network test system based on typical ghost imaging

A technology for network testing and ghost imaging, applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of changing the power of the electrical signal, affecting the imaging results, and the high price of the vector network analyzer. Reduce the number of inspections, good results, and the effect of reducing equipment costs

Active Publication Date: 2019-01-18
BEIJING INSTITUTE OF TECHNOLOGYGY
View PDF7 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the existing vector network analyzer also has many shortcomings in the application process: when measuring electronic components, if there is interference from nonlinear devices, the results obtained by the vector network analyzer will be unreliable
Because under the influence of nonlinear devices, the power of the passing electrical signal will be changed, thus affecting the final imaging result
In addition, the price of the vector network analyzer is also very high. For these reasons, the vector network analyzer cannot be used to measure the frequency response of components with nonlinear device interference. Therefore, there is an urgent need for a A low-cost network test system that also has a good effect on the frequency response of components interfered by linear devices

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Network test system based on typical ghost imaging
  • Network test system based on typical ghost imaging

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0023] The schematic diagram of the network test system in this embodiment is as follows figure 1 As shown, the whole system includes a computer control system 1, to measure the frequency response of the component under test 4. Described oscilloscope 3 is connected with described computer control system 1, and an output end of described function generator 2 is directly connected with an input end of described oscilloscope 3, and another output end of described function generator 2 is connected with DUT 4, and the other input of the oscilloscope 3 is connected to the output of the DUT 4. At the beginning of the measurement, the oscilloscope 3 and the function generator 2 are initialized first. After the initialization is completed, the function generator 2 sends an uninterrupted random noise signal, the random noise signal passes through the component under test 4 all the way, and is finally received by the input terminal of the oscilloscope 3 and measures its waveform after p...

Embodiment 2

[0026] The schematic diagram of the network test system in this embodiment is as follows figure 2 As shown, the difference between the whole system and Embodiment 1 is that the noise source 5 and the power divider 6 connected in series are used instead of the function generator 2 to measure the frequency response of the component under test 4, and the rest are the same. The oscilloscope 3 is connected with the computer control system 1, the output end of the noise source 5 is connected with the input end of the power divider 6, one output end of the power divider is directly connected with an input end of the oscilloscope 3, and the other output end of the power divider 6 is One terminal is connected to the input terminal of the DUT 4, and the other input terminal of the oscilloscope 3 is connected to the output terminal of the DUT 4. At the beginning of the measurement, the oscilloscope 3 is first initialized. After the initialization is completed, an uninterrupted random n...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a network test system based on typical "ghost" imaging. The network test system also has relatively good effect when measuring a frequency response of a component having interference of a nonlinear device, and the cost is low. According to the system provided by the invention, a principle of the "ghost" imaging (correlated imaging) is adopted, and a compressed sensing algorithm is utilized to obtain a frequency characteristic curve of a to-be-tested component at last. Compared with a vector network analyzer upon which the traditional network test system is based, the system provided by the invention is based on the compressed sensing algorithm, so that the number of times of detection can be effectively reduced, the equipment cost is reduced, and the system has alsorelatively good effect when measuring the frequency response of the component having the interference of the nonlinear device.

Description

technical field [0001] The invention belongs to the technical field of network testing, in particular to a network testing system based on classic "ghost" imaging. Background technique [0002] Existing network testing systems are mainly based on vector network analyzers for network testing. Vector network analyzers are powerful network testing instruments that can achieve extremely high precision when used correctly. It is also widely used and indispensable in many industries, especially useful in measuring the linear characteristics of radio frequency (RF) components and equipment. [0003] But the existing vector network analyzer also has many deficiencies in the application process: when measuring electronic components, if there is interference from nonlinear devices, the results obtained by the vector network analyzer will be unreliable. Because under the influence of the nonlinear device, the power of the passing electrical signal will be changed, thereby affecting th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/28
CPCG01R27/28
Inventor 张晓殷赫
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products