DMD chip temperature monitoring method and device

A monitoring device and chip technology, applied in temperature control, non-electric variable control, control/regulation system, etc., can solve the problems of DMD chip damage, high temperature, limited temperature resistance, etc.

Active Publication Date: 2018-12-21
CHINA FILM EQUIP
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The temperature resistance of DMD chips is usually limited. Therefore, when the brightness of the light spot is too high, or the position of the light spot on the DMD chip is shifted, the temperature of the DMD chip will be higher than the maximum temperature resistance value, which will cause the DMD chip to damaged

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • DMD chip temperature monitoring method and device
  • DMD chip temperature monitoring method and device
  • DMD chip temperature monitoring method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0051] Such as figure 1 As shown, one embodiment of the present invention provides a kind of temperature monitoring method of DMD chip, comprises:

[0052] Sensing the working temperature of different positions of the DMD chip;

[0053] Determine the relationship between the operating temperature of different positions of the DMD chip and the first preset threshold and the second preset threshold:

[0054] If at least one of the operating temperatures at different positions of the DMD chip is greater than the first prese...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a DMD chip temperature monitoring method and device. The method comprises the steps that operating temperatures at different positions of a DMD chip are sensed; whether at least one of all the operating temperatures is greater than a first preset threshold or not is judged; if yes, a shutdown alarm is given, or otherwise whether at least one of all the operating temperatures is greater than a second preset threshold or not continues to be judged; if yes, a brightness lowering alarm is given, or otherwise whether the difference between the operating temperature at the front position and the operating temperature at the back position is greater than a third preset threshold or not continues to be judged; if yes, a shutdown alarm is given, or otherwise whether the difference is greater than a fourth preset threshold or not continues to be judged; and if yes, a brightness lowering alarm is given, or otherwise an alarm is not given, and sensing and judgment continueto be performed. Through the DMD chip temperature monitoring method and device, the operating temperatures of the DMD chip can be monitored in real time, and corresponding alarms can be given according to different conditions of the operating temperatures and the difference between the operating temperature at the front position and the operating temperature at the back position.

Description

technical field [0001] The invention relates to the technical field of projection equipment. More specifically, it relates to a temperature monitoring method and device for a DMD chip. Background technique [0002] At present, the widely used DLP (Digital Light Processing, digital light processing) projector is based on a DMD (Digital Micromirror Device, digital micromirror device) chip to complete visual digital information display. In a DLP projector, the light beam passes through a series of lenses and then exits onto the DMD chip. The display image of the DMD chip is irradiated by the light spot and then reflected to the lens for projection to form a projected image. The DMD chip is a key component in a DLP projector, and its performance largely determines the overall performance of the DLP projector. [0003] When the light spot is irradiated on the DMD chip, the DMD chip reflects the light spot. Since the DMD chip cannot completely reflect the non-spot, part of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G05D23/22
CPCG05D23/22
Inventor 郭克威
Owner CHINA FILM EQUIP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products